聚合物中属性测定检测方案(核磁共振)

OXFORDINSTRUMENT SThe Business ofScience@Oxford Instruments 2019 聚合物和聚合物相属性的测定 The atomic force microscope (AFM) is a powerful tool forcharacterizing polymer materials. It provides nanoscaleinformation on a wide range of physical properties andbehaviour in addition to imaging morphology. Whetherinvestigating fundamental principles of polymer science orengineering a specific polymer solution (Figure 2)， the AFM is a key instrument for evaluating polymers at small length scaleslts spatial resolutionenables visualisation of sub-micrometer and sub-nanometer polymer morphology. But AFMscan contribute much moreinformation about polymers besides simple topographicmorphology， including probing molecular-level forces， mapping mechanical， thermal， andelectrical properties and assessing solvent and thermal effects in near real time. The atomic force microscope (AFM) is a powerful tool for characterizing polymer materials. It provides nanoscale information on a wide range of physical properties and behaviour in addition to imaging morphology. Whether investigating fundamental principles of polymer science or engineering a specific polymer solution (Figure 2), the AFM is a key instrument for evaluating polymers at small length scalesIts spatial resolution enables visualisation of sub-micrometer and sub-nanometer polymer morphology. But AFMs can contribute much more information about polymers besides simple topographic morphology, including probing molecular-level forces, mapping mechanical, thermal, and electrical properties and assessing solvent and thermal effects in near real time.