ATR棱镜选择标准

衰减全反射（ATR）可用于在固体或液体样品的表面进行几微米深度的IR光谱分析。该技术的优点在于，路径长度由倏逝场的穿透深度控制。为了与从棱镜表面传播的倏逝场相互作用，要测量的样品必须与晶体紧密接触。光进入样品的穿透深度取决于晶体和样品的折射率、光入射到晶体的角度和波长。穿透深度、测量范围和耐久性取决于用于构建棱镜的材料。通常用于棱镜的晶体材料的特征本应用中所示。Application Note280AT0003-E ATR PrismSelection Criteria2/2Application Note Introduc t ion Attenuated total r eflectance (ATR) can be used to perform IR spect r al ana l ysis at the surface of solid or liquid samples to a depth of a few microns. The benef i t of this techn i q u e i s that the path length is con t rolled by the penetration depth of an evanescent field. To in teract with the evanescent fie l d propagated f r om the surface of the prism， the sample to be measured must be i n i ntimate contact with crystal . The penetrat i on dept h of li g h t into the sample depends on the refractive i ndex of both t h e crystal and the sample， the ang l e of incidence of t h e light to the crystal and the wavelengt h . The penetrat i on dept h ， measurement range and du r abi li ty depend on the mater i al used to construct the pr i sm. The features of crystal materials commonly used for pr i sms are shown below. *3 Meas ur e m ent u s ing A TR PRO 450-S， stand a rd FTIR. Keyword s ATR， p rism， diamond， Ge ， Z n Se ， re f r a c t i ve index Figure 1. Suit a b le m ea surem e nt exa m p l e u si n g Z n Se a n d G e p r i s m.Sample： et h anol JASCO USA UASGO 28600 Mary's Cour t ， E a s to n ， M D 21601US A T el ： (800) 333-5272 F ax： (410) 822-7526A ppl ic a tio n Lib r ary： ja s c o i n c.com /appli c a t i o ns