纳米光子学中极化检测方案(电镜部件)

Software CL Polarimetry in the SPARC Angle-resolved polarimetry Rotating plate polarimeter consisting of a quarter-wave plate (QWP) and linear polarizer (LP) ·Polarization is different for every emission angle ·Correction for the mirror to go from detector to sample plane Polarimetry Workflow Polarimeter settings 6x Measure 6 angular patterns at distinct polarimeter settings and correct for mirrordistortion. This correction is critical for resolving the polarization correctly. For thepolarization description and mirror correction we use the Stokes/Mueller formalism Example data for six polarimeter settings Example of six polarization filtered measurements. Togetherthese are used to reconstruct the full polarization state Polarimetry module occupies both opticsmodule slots in SPARC Hardware included in system： ·Quarter waveplate in motorized rotation mount ·Quarter waveplate is exchangeable such that it can beoptimized for specific wavelength regimes ·Linear polarizer in motorized rotation mount · Motorized lens for spectroscopy (motor can be used forfine alignment) ·Motorized Fourier lens to switch to angle-resolved mode·Electrical and digital interface with SPARC CL system ·Electrical ID for software identification Software included in Odemis software package： ·Control of all motorized hardware ·Automated polarimetry acquisition with drift correction ·Display of (raw) data Additional Software included： ·Mirror correction and stokes parameter ·Plotting of all polarization data Applications Results were measured at AMOLF(Netherlands) in the group of Prof. Albert Polman*8 Breaking symmetry through excitation position ·Move e-beam away from center ·Off-normal beaming ·Stronger Ecomponent ·Elliptical/circular polarization Chiral structures： Spiral bullseyes Degree of circular pol. DOCP=1 =LHC (ACW) DOCP=-1=RHC (CW) Spiral with pitch of 440 nm DOCP=1=LHC (ACW) DOCP=-1=RHC(CW) Degree of polarization Degree of polarization (DOP)allows retrieval of polarized(SO*DOP) and unpolarized(S0*DOUP) part of emission. Thiscan be used to separatecoherent and incoherent CLemission. Furthermore it can beused to assess the polarizingproperties of nanostructures. GaAs Polarimetry on vertical InP wire =830-870 nm Wire geometry has a strong polarizing effect on the emission ·FHorizontal GaAs wire onlacey carbon membrane waveguide coupling ·1Interference end facets ●Important for use asoptoelectronic device! |ExK EyF Ez 3 5 5 c c c 0 0 0 0.73 oc Oo 0 0 0 Dr. Toon Coenen Hardware included in system:• Quarter waveplate in motorized rotation mount• Quarter waveplate is exchangeable such that it can be optimized for specific wavelength regimes• Linear polarizer in motorized rotation mount• Motorized lens for spectroscopy (motor can be used for fine alignment)• Motorized Fourier lens to switch to angle-resolved mode• Electrical and digital interface with SPARC CL system• Electrical ID for software identification