铜样品中电化学腐蚀后的表面形貌检测方案(扫描探针)

Yo(nanoSurfFig 4.： Cleaned surface after edging in wather Electro chemical corrosion of copper AFM ： Easyscan 2 FlexAFM LSMeasurement Mode： DynamicCantilever： NCLRAdditional equipment： CH Instruments Electro chemical Analyser Cu metal piece (working electrode)was taken and electrical contacts are givenusing crocodile clips， care has ben taken crocodile clips are away from thesolvent for possible corrosion in the cell leads. Ag/AgCl reference and counterelectrode are inserted in the cell. All the electrodes are dipped in 100mM NaClin water. Morphology of Cu metal was taken in dynamic mode Fig 1.OCP was measuredto be -0.347V， Tafel and pitting coorosion measurments were done to determinethe pitting potentials. A positive potential of0.6V was applied for a minute，morphology was taken Fig 2， some changes in the morphology is seen， samepotential was applied for another minute one could see some bubbles in thesolution， the topography Fig 3 shown quite a bit ofchanges， the electrochemicaletching of Cu leads to the material coming out of metal surface， leaving smallparticles around the surface. Drags of partcile depostis are seen in themorphology. Again One more minute 0.6V was applied， at this stagemorphology was not possible because of interference ofetched material formingcloudy solution masking the laser beam. At this stage Cu metal was taken outand washed thoroughly dipped in the fresh solution， AFM measurements weredone again， now the morphology shows pits in the surface (Fig 4). Average dia and depth of the pit found to be . Similar experiments were carriedout on SS metal by applying +1V， even after 10minutes no change in the morphology was seen (Fig 5&6) and is resistant tocorrosion. Electro chemical corrosion of copper Fig 1.： Initial Topography in NaCl solution Fig 2： Topo after 75s chemical edging at 600mV Fig 3： Topo after 150s chemical edging at Initail Copper-NaCI-Scan forward， Topography (1 /6) Copper-NaCI 150s at 600mV-Scan forward， Topography (1 /6) um Fig 5.： Initial Stainless Steal Fig 6.：SSS after 10min with 1V Smart Instruments for Nanoscience & Nanotechnology-Microscopy Made EasyPage 在以下方面，easyScan 2扫描隧道显微镜是最理想的工具 在石墨上用易完成的原子分辨率进行非常高分辨率测量 轻松进入纳米世界 大气环境中日常的实验室工作 瑞士Nanosurf公司，全球知名的专业研发扫描探针原子力显微镜制造商和技术服务供应商，在扫描探针原子力显微镜领域有超过15年的研发经验，一直致力于新型扫描探针原子力显微镜的创新性研发和制造。目前已推出新一代低噪音-快速扫描-超高稳定性的AFM 和大扫描范围Nanite AFM系统。瑞士Nanosurf公司承诺提供最高品质的服务和客户支持，同时还提供纳米技术的OEM 客户定制，外包等业务。技术参数：1. 扫描隧道显微镜扫描头 最大扫描范围： X和Y方向0.5um x 0.5um（可以选择1um x 1um） xy轴分辨率： 0.015nm 最大扫描范围： Z方向200nm z轴分辨率： 0.003nm 扫描速度： 每128个数据点，60ms/line 槽压： 5 mV 阶段时，±10 V 设定点电流： 25 pA阶段时，±100 nA 反馈回路宽带： 3kHz 自动接近样品 没有使用危险的高电压 包括高效减幅阶段 用0.25 mm的 Pt/Ir 金属丝作为扫描尖端 2. 扫描隧道显微镜电子控制器 数据采集时，可以和任何标准计算计串行端口连接 三个轴都有16位的数据收集与控制系统 轴输出电压：+12V 附加的独立的12位的ADC输入选件 外部电源 可以升级运行AFM扫描仪3. 扫描隧道显微镜软件 测量数据可以实现可视化 不同的窗体的扫描数据可以被同时显示 线观察，点观察，3维观察 在线数学计算功能（减，平均值等等） 可以实现多数据输出 定制显示器、工作场所 多用光谱功能 I-V和I-z曲线测量4. 扫描隧道显微镜可利用的附件和消耗品 覆盖10倍放大高质量光学镜的透明层 全部的STM工具（刀具，钳子，镊子） 提供STM原理信息手册 样品：HOPG，Gold 薄膜，MoS2 云母片上的取向薄膜Gold (111) 接触样品的银粉漆 Pt/Ir STM金属丝(直径为0.25mm)主要特点：可以在大气下进行任何STM实验设计小巧、紧凑；使用简便、舒适扫描仪配置了易接近和可视扫描端自动接近样品所有的功能可以在一台计算机上进行与标准计算机串行端口连接（不需要接界面卡）特殊的扫描仪设计，确保低震动灵敏度