Ensuring the quality of steel Steel manufacturers test the quality of their products by measuring several elements in the steel to ensure the grade and performance of their final product. Different grades of steel have different specifications for elemental content.

本文介绍了一种使用 ICP-OES 测定金属样品基体中，氢氟酸介质下硅元素的方法，采用了安捷伦无硅涂层的耐氢氟酸进样系统，克服了常规 ICP-OES 分析氢氟酸介质空白值高的缺点，获得了较低的空白值，适合于测定多种金属基体中不同含量范围的硅元素。

采用 Agilent 8800 ICP-MS/MS 的化学分离为消除棘手的干扰问题提供了巨大潜力，无需进行繁琐的样品前处理。此外，还开辟了使用高分辨率扇形磁场 ICP-MS 无法解决的应用领域。在无法进行样品前处理的情况下（例如通过激光剥蚀 ICP-MS 进行直接分析），化学分离与 MS/MS 技术联用能够可靠地去除干扰，且无需复杂且通常不可靠的数学校正。

本应用介绍了一种使用串联四极杆 ICP-MS (ICP-MS/MS)测量高纯度铜中超痕量杂质的新方法。针对 Agilent 8900ICP-MS/MS 开发出一种可选的离子透镜（称为“m 透镜”），从而能够在耐受基质的高功率等离子体条件下对超低浓度的碱金属进行测量。m 透镜具有优化的几何结构，可最大程度减小沉积在 ICP-MS 接口组件上的 EIE 背景信号。

激光剥蚀-ICP-MS (LA-ICP-MS) 可用于固体样品和粉末中的元素分析，其中包括地质材料、陶瓷、生物组织和法医样品。本研究使用两种校准策略（基质匹配和非基质匹配）对高纯度金属进行定量分析。LA-ICP-MS 可直接分析固体样品，因此与标准液体样品进样相比，固体样品只需极少的样品前处理步骤。由于无需溶出过程，降低了分析物损失的风险，也避免了引入污染物。但是，由于缺少固体校准标样，LA-ICP-MS 分析可能难以实现精确定量分析。用于固体样品分析的校准标样比用于液体样品分析的校准标样更难以制备，含合适浓度分析物的基质匹配的固体校准标样也比较少见。在金属行业等少数领域中可能已经获得特征明确的基质匹配标准品，因为电弧/火花或辉光放电 (GD) 光学发射光谱 (OES) 等成熟分析技术中使用固体标样。

为实现金属表面的高效胶粘，要求金属表面要高度清洁。使用带掠角探头的 4100 ExoScan FTIR 可以实现金属表面清洁度的现场鉴定和定量分析。金属被清洁以后，可以使用分析器检测金属上是否存在有机和无机污染物。即使是很少量的污染也可以严重降低粘合强度，而高灵敏度的 4100 ExoScan 可以检测到痕量级别的污染物。

"手持式 Agilent 4100 ExoScan FTIR 可有效测定铝板上的环氧树脂底漆厚度。校准技术有助于准确预测。足够的灵敏度可以检测到极小的厚度差异，该系统是飞机分析应用的理想选择。本研究论证了采用 4100 ExoScan FTIR 测定铝板上环氧树脂底漆厚度的方法应用。文中采用 4100 ExoScan FTIR 无损测定了一系列具有不同漆层厚度的标准品，得出的吸光度值和漆层厚度的关系与使用实验室红外测试的结果一致。所以，用校正过的标准曲线去测试未知样品的漆层厚度时，得出的结果是准确可靠的。"

不同等级的钢具有不同的元素含量指标，大多数钢和不锈钢等级规定 硫的重量百分比小于 0.05%，且磷的重量百分比小于 0.04%。利用电 感耦合等离子体发射光谱 (ICP-OES) 技术能够轻松测量样品中这一浓度范围内的元素，实验室从期望能否“完成工作”进一步考虑特定仪 器能否提高其样品通量、降低成本、简化样品前处理和仪器运行，以 及能否在大批样品分析过程中提供可靠的结果。本应用简报证明了 Agilent 5100 垂直双向观测 (VDV) ICP-OES 仪器在使用 GB/T 20125-2006 方法分析钢铁样品时的性能和优势。该仪器在这一应用中具有许多优势，包括能够快速分析大量具有挑战性的钢铁样品。

安捷伦智能化样品在线导入系统 SIPS 可将标准溶液、样品溶液和基质改性剂精确地导入原子吸收系统的雾化系统中。安捷伦样品在线导入系统包括 SIPS 10 和 SIPS 20 两个型号。SIPS 10 可实现标准溶液的自动配制与超范围样品的智能在线稀释。实验人员只需配制一种最高浓度的标准溶液作为母液，即可自动稀释获得其它浓度的标准溶液。对于超出标准曲线范围的样品，SIPS 可智能设定稀释倍数，经智能自动稀释后进样。SIPS 20 除具有 SIPS 10 的功能之外，还具有自动标准加入、自动加标回收、自动添加基质改性剂、自动添加内标等功能。

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Monitoring and controlling the level of trace element impurities in metals and alloys is important, as impurities can affect the properties of the metal and may degrade the functionality of the finished component. ICP-OES is commonly used for the routine measurement of trace elements in metal samples because of its multi-element capability and tolerance of the high matrix level present in metal sample digests. However, the development of high purity metals and higher-performance alloys requires stricter control of a wider range of trace elements at lower concentrations, so a technique with lower detection limits than ICP-OES is required. ICP-MS offers low detection limits for the elements of interest, but the technique has not previously been considered suitable for the analysis of high matrix samples such as metal digests. For example, conventional ICP-MS instruments may suffer from signal suppression and/or long-term signal drift due to matrix deposition on the interface cones, which affects the signal stability and the accuracy of the analytical results. To overcome this limitation, Agilent’s Ultra High Matrix Introduction (UHMI) aerosol dilution technology has been developed to allow the

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.

Steel manufacturers conduct quality control testing for a range of metals and trace elements to ensure the grade and performance of their final product. The Standardization Administration of China uses their GB/T 20125-2006 standard “Low-alloy steel – Determination of multi-element contents – Inductively coupled plasma atomic emission spectrometric method” to control the quality of manufactured steel products. Different grades of steel have different specifications for elemental content, with most steel and stainless steel grades required to have less than 0.05 % by weight of Sulfur and 0.04 % by weight of Phosphorus. With the Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) technique easily able to measure elements at this concentration within a sample, laboratories are looking beyond whether an instrument can ‘do the job’ to whether a specific instrument can improve their sample throughput, lower their costs, simplify sample preparation and instrument operation, and deliver reliable results throughout the analysis of a large batch of samples. 2 This application note demonstrates the performance and benefits of Agilent’s 5100 Vertical Dual View (VDV) ICP-OES instrument in the analysis of steel samples, using the GB/T 20125-2006 method. The instrument offers many advantages for this application, which involves the rapid analysis of a large number of challenging steel samples.