摘要 本报告详细说明配备整体式钻石晶体衰减全反射 (ATR) 附件的 Agilent Cary 630 FTIR 光谱仪可用于矿物样品的简单快速测定。通过根据谱图库的相互参照，可以利用所得的谱图对矿物类型进行定性鉴定。

绿松石是一类优质玉材，在宝石交易市场上广受青睐。与此同时，优质绿松石供不应求，市场上改质品和仿品泛滥，对绿松石产品进行真伪鉴别和优劣检测的需求不断增长。本文采用配备衰减全反射 (ATR) 探头附件的 Agilent Cary 4300手持式红外光谱仪成功实现对绿松石样品的现场无损检测，实验证明该系统简便、快速、无损样品且结果直观可靠，非常适合对绿松石等珠宝玉石类样品进行真伪鉴别和定性分析。

在本研究中，48 种元素（3 种内标和 45 种分析物）采用ICP-MS 分析，每个样品分析时间为 90 秒，在超过 6 小时内获得了优异的稳定性。对于高 TDS 岩石消解液的长序列，UHMI 和 ISIS-DS 提供了无与伦比的基质耐受性和极小的漂移。使用氦模式提高了分析可信度且降低了检测限，而仅增加了极少测量时间。此外，He 模式的使用将低质量数、高浓度元素的动态范围扩展至数千 ppm，因而能够在一次测量中分析这些样品。

本文使用三种样品制备技术（敞口酸消解、微波消解和碱熔）定量矿物中稀土元素，同时还对比了 ICP-MS/MS 与其他仪器（MIP-AES，ICP-AES 和 ICP-MS）的分析性能。研究表明，ICP-MS/MS 法测得的稀土元素浓度与标准物质参考值非常吻合，比其他分析方法更适合于稀土元素的定量分析，对稀土同位素测定具有更强的干扰消除能力和更低的检测限 2。ICP-MS/MS 方法检出限远低于其他分析仪器，非常适合矿物中痕量稀土元素的测定，这得益于 ICP-MS/MS 超高的灵敏度。

Agilent 8800 电感耦合等离子体串联质谱仪（也称为 ICP-MS/MS）因其独特的 MS/MS 反应模式而能提供卓越的反应池性能。第一个主四极杆 (Q1) 位于八极杆反应池系统 (ORS3) 的前面，作为 1 amu 质量过滤器严格控制进入反应池的离子。只有具有目标分析物质量数的离子才能进入反应池；而所有其他质量数则被排除。由于等离子体和基质中的干扰离子被 Q1 消除，池内的反应过程大为简化而且更容易预测，使得 Agilent 8800 ICP-MS/MS 可以广泛应用于解决棘手的干扰问题。本应用简报将介绍消除 MH+ 对稀土元素 (REE) 的干扰。

硒在环境和农业研究以及人体健康中都是一种重要的元素，因为它是一种基本的营养微量元素，但过量以后也具有毒性。硒的某些化学形式的作用也是防癌研究的重要课题。ICP-MS 是硒总量和硒形态测量首选的分析方法，但是 ICP-MS 准确定量痕量级硒也有一定难度，原因如下： • 硒的第一电离能高 (IP = 9.75 eV)，这意味着它在等离子体中电离度差，因而其信号强度低 • 由于硒电离不充分，在高基质样品中会受到信号抑制，再加上缺少具有相似质量和电离能的内标元素使问题更加复杂 • 在实际样品分析中，所有对分析有用的硒同位素都存在多种质谱干扰（详见表 1） • 分离所有质谱干扰物所需要的分辨率超出扇形高分辨 ICP-MS 的能力

地质调查和采矿业在样品数量、元素数量、时间/成本限制和复杂基质方面提出了高分析要求。根据元素和浓度的范围不同，一些样品需要分析两次：浓度较高的元素采用 ICP-OES（电感耦合等离子体发射光谱）分析，而痕量元素采用 ICP-MS 测量。对于这些样品，单次分析可提高效率，并降低每个样品的成本。尽管 ICP-MS 是唯一能够测量所有必需痕量元素的技术，但是岩石消解液中宽范围的分析物浓度、高酸浓度和高总溶解固体 (TDS) 对这项技术提出了挑战。

过去一直使用火焰原子吸收系统 (FAAS) 或配备垂直炬管的径向 ICP-OES 分析地质样品。但是这些技术却难以实现低成本、高通量地分析地化样品。地化样品中元素众多且浓度不一，需要多次稀释，尤其是使用 FAAS 时更是如此。此外，样品中还含有高浓度的总溶解固体 (TDS)，从而导致需要 频繁清洗样品引入系统。本应用简报使用 Agilent 5100 同步垂直双向观测 (SVDV) ICP-OES 来分析含有最高 2.5% TDS 的地化样品。本文展示了该仪器的准确度和灵活性，还测定了样品测量速率和每个样品的氩气消耗量。

电感耦合等离子体光学发射光谱 (ICP-OES) 以其多元素分析能力、宽线性动态范围和操作简便而成为一种测定 REE 不错的替代方法。此外，在一些情况中，应用其他仪器方法时，获取样品特征检验其他目标分析物的潜在干扰元素至关重要。例如，相比于 ICP-MS 测定双电荷物质（如 150Sm2+ 和 150Nd2+）产生 75As+ 的干扰数量级，ICP-OES 能够更灵活地选择无干扰的发射波长和观测位置。本研究采用 Agilent 5100 同步垂直双向观测 (SVDV) ICP-OES（5110 SVDV ICP-OES 也适用于本应用）测定地质样品中的 REE（Dy、Er、Eu、Gd、Ho、La、Lu、Nd、Pr、Sc、Sm、Tb、Th 和 Tm）。在 SVDV 观测模式下，通过一次读数获取轴向和径向等离子体观测数据，5100 和 5110 仪器能够实现同步测量。同步垂直双向观测 (SVDV) 模式能够节省数据采集时间，从而减少每个样品的氩气消耗量。

Traditionally, geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with a vertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can be challenging when using these techniques. The samples often have a wide range of element concentrations, requiring multiple dilutions, particularly when using FAAS. The samples also have high levels of total dissolved solids (TDS), which requires frequent cleaning of the sample introduction system. In this application note, the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containing up to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument, the sample measurement rate and argon consumption per sample were determined.

Traditionally, geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with a vertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can be challenging when using these techniques. The samples often have a wide range of element concentrations, requiring multiple dilutions, particularly when using FAAS. The samples also have high levels of total dissolved solids (TDS), which requires frequent cleaning of the sample introduction system. In this application note, the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containing up to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument, the sample measurement rate and argon consumption per sample were determined.

Traditionally, geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with a vertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can be challenging when using these techniques. The samples often have a wide range of element concentrations, requiring multiple dilutions, particularly when using FAAS. The samples also have high levels of total dissolved solids (TDS), which requires frequent cleaning of the sample introduction system. In this application note, the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containing up to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument, the sample measurement rate and argon consumption per sample were determined.

Traditionally, geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with a vertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can be challenging when using these techniques. The samples often have a wide range of element concentrations, requiring multiple dilutions, particularly when using FAAS. The samples also have high levels of total dissolved solids (TDS), which requires frequent cleaning of the sample introduction system. In this application note, the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containing up to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument, the sample measurement rate and argon consumption per sample were determined.

Traditionally, geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with a vertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can be challenging when using these techniques. The samples often have a wide range of element concentrations, requiring multiple dilutions, particularly when using FAAS. The samples also have high levels of total dissolved solids (TDS), which requires frequent cleaning of the sample introduction system. In this application note, the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containing up to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument, the sample measurement rate and argon consumption per sample were determined.

Traditionally, geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with a vertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can be challenging when using these techniques. The samples often have a wide range of element concentrations, requiring multiple dilutions, particularly when using FAAS. The samples also have high levels of total dissolved solids (TDS), which requires frequent cleaning of the sample introduction system. In this application note, the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containing up to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument, the sample measurement rate and argon consumption per sample were determined.

Traditionally, geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with a vertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can be challenging when using these techniques. The samples often have a wide range of element concentrations, requiring multiple dilutions, particularly when using FAAS. The samples also have high levels of total dissolved solids (TDS), which requires frequent cleaning of the sample introduction system. In this application note, the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containing up to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument, the sample measurement rate and argon consumption per sample were determined.

Traditionally, geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with a vertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can be challenging when using these techniques. The samples often have a wide range of element concentrations, requiring multiple dilutions, particularly when using FAAS. The samples also have high levels of total dissolved solids (TDS), which requires frequent cleaning of the sample introduction system. In this application note, the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containing up to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument, the sample measurement rate and argon consumption per sample were determined.

Traditionally, geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with a vertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can be challenging when using these techniques. The samples often have a wide range of element concentrations, requiring multiple dilutions, particularly when using FAAS. The samples also have high levels of total dissolved solids (TDS), which requires frequent cleaning of the sample introduction system. In this application note, the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containing up to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument, the sample measurement rate and argon consumption per sample were determined.

4200 MP-AES 的推出大大扩展了 MP-AES 的应用范围，完全涵盖了极富挑战性的地化样品。第二代 4200 MP-AES 拥有先进的微波腔和炬管，能够应对溶解态固体含量高的样品，与 FAAS 相比，它的检测限更低，工作范围更宽。MP-AES使用氮气运行，无需使用昂贵且危险的气体（如乙炔），大大提高了安全性，而且即使在偏远地区也可实现无人值守的运行。

4200 MP-AES 的推出大大扩展了 MP-AES 的应用范围，完全涵盖了极富挑战性的地化样品。第二代 4200 MP-AES 拥有先进的微波腔和炬管，能够应对溶解态固体含量高的样品，与 FAAS 相比，它的检测限更低，工作范围更宽。MP-AES使用氮气运行，无需使用昂贵且危险的气体（如乙炔），大大提高了安全性，而且即使在偏远地区也可实现无人值守的运行。

4200 MP-AES 的推出大大扩展了 MP-AES 的应用范围，完全涵盖了极富挑战性的地化样品。第二代 4200 MP-AES 拥有先进的微波腔和炬管，能够应对溶解态固体含量高的样品，与 FAAS 相比，它的检测限更低，工作范围更宽。MP-AES使用氮气运行，无需使用昂贵且危险的气体（如乙炔），大大提高了安全性，而且即使在偏远地区也可实现无人值守的运行。

4200 MP-AES 的推出大大扩展了 MP-AES 的应用范围，完全涵盖了极富挑战性的地化样品。第二代 4200 MP-AES 拥有先进的微波腔和炬管，能够应对溶解态固体含量高的样品，与 FAAS 相比，它的检测限更低，工作范围更宽。MP-AES使用氮气运行，无需使用昂贵且危险的气体（如乙炔），大大提高了安全性，而且即使在偏远地区也可实现无人值守的运行。

4200 MP-AES 的推出大大扩展了 MP-AES 的应用范围，完全涵盖了极富挑战性的地化样品。第二代 4200 MP-AES 拥有先进的微波腔和炬管，能够应对溶解态固体含量高的样品，与 FAAS 相比，它的检测限更低，工作范围更宽。MP-AES使用氮气运行，无需使用昂贵且危险的气体（如乙炔），大大提高了安全性，而且即使在偏远地区也可实现无人值守的运行。

4200 MP-AES 的推出大大扩展了 MP-AES 的应用范围，完全涵盖了极富挑战性的地化样品。第二代 4200 MP-AES 拥有先进的微波腔和炬管，能够应对溶解态固体含量高的样品，与 FAAS 相比，它的检测限更低，工作范围更宽。MP-AES使用氮气运行，无需使用昂贵且危险的气体（如乙炔），大大提高了安全性，而且即使在偏远地区也可实现无人值守的运行。

4200 MP-AES 的推出大大扩展了 MP-AES 的应用范围，完全涵盖了极富挑战性的地化样品。第二代 4200 MP-AES 拥有先进的微波腔和炬管，能够应对溶解态固体含量高的样品，与 FAAS 相比，它的检测限更低，工作范围更宽。MP-AES使用氮气运行，无需使用昂贵且危险的气体（如乙炔），大大提高了安全性，而且即使在偏远地区也可实现无人值守的运行。

安捷伦已开发出了 4100 MP-AES 微波等离子体原子发射光谱仪，该新光谱仪在分析性能方面已超越了 FAAS，并且具有更低的操作成本和夜间无人值守的功能。Agilent 4100 MP-AES 是具有高基体耐受力和高样品通量的高度自动化多元素分析系统。这确保了快速可靠地分析具有挑战性的样品，且几乎不需要对操作人员培训并且简化了方法开发。

安捷伦已开发出了 4100 MP-AES 微波等离子体原子发射光谱仪，该新光谱仪在分析性能方面已超越了 FAAS，并且具有更低的操作成本和夜间无人值守的功能。Agilent 4100 MP-AES 是具有高基体耐受力和高样品通量的高度自动化多元素分析系统。这确保了快速可靠地分析具有挑战性的样品，且几乎不需要对操作人员培训并且简化了方法开发。

安捷伦已开发出了 4100 MP-AES 微波等离子体原子发射光谱仪，该新光谱仪在分析性能方面已超越了 FAAS，并且具有更低的操作成本和夜间无人值守的功能。Agilent 4100 MP-AES 是具有高基体耐受力和高样品通量的高度自动化多元素分析系统。这确保了快速可靠地分析具有挑战性的样品，且几乎不需要对操作人员培训并且简化了方法开发。

安捷伦已开发出了 4100 MP-AES 微波等离子体原子发射光谱仪，该新光谱仪在分析性能方面已超越了 FAAS，并且具有更低的操作成本和夜间无人值守的功能。Agilent 4100 MP-AES 是具有高基体耐受力和高样品通量的高度自动化多元素分析系统。这确保了快速可靠地分析具有挑战性的样品，且几乎不需要对操作人员培训并且简化了方法开发。

安捷伦已开发出了 4100 MP-AES 微波等离子体原子发射光谱仪，该新光谱仪在分析性能方面已超越了 FAAS，并且具有更低的操作成本和夜间无人值守的功能。Agilent 4100 MP-AES 是具有高基体耐受力和高样品通量的高度自动化多元素分析系统。这确保了快速可靠地分析具有挑战性的样品，且几乎不需要对操作人员培训并且简化了方法开发。