牛津仪器INCAEnergy+元素分析系统_参数

核心参数

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综合钢铁/金属

材料中高空间分辨率显微分析检测方案(扫描透射电镜)
Introduction There is increasing need for the micro-analyst to correctly determine chemical composition of regions on the sub-micron scale. Field emission SEMs offer an ideal tool for these tasks due their excellent spatial resolution and high brightness sources. However, in order to analyze these types of samples the accelerating voltage of the electron beam is commonly in the range 1-5kV. Traditionally when working at these voltages low count rates necessitated the use of EDS detectors with large crystals to maximize collection solid angle. Analysis using EDS at low kV is, however, complicated by the large number of overlapped X-ray lines seen in this part of the spectrum. New field emission SEMs that offer high currents at low kV are opening new opportunities to use the higher spectral resolution and sensitivity of WDS to analyze samples on the sub-micron scale.
钢铁/金属 2020-06-16

材料中高空间分辨率显微分析检测方案(扫描透射电镜)
Introduction There is increasing need for the micro-analyst to correctly determine chemical composition of regions on the sub-micron scale. Field emission SEMs offer an ideal tool for these tasks due their excellent spatial resolution and high brightness sources. However, in order to analyze these types of samples the accelerating voltage of the electron beam is commonly in the range 1-5kV. Traditionally when working at these voltages low count rates necessitated the use of EDS detectors with large crystals to maximize collection solid angle. Analysis using EDS at low kV is, however, complicated by the large number of overlapped X-ray lines seen in this part of the spectrum. New field emission SEMs that offer high currents at low kV are opening new opportunities to use the higher spectral resolution and sensitivity of WDS to analyze samples on the sub-micron scale.
钢铁/金属 2020-06-16

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