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牛津仪器X-MaxTEM大面积硅漂移探测器

牛津仪器X-MaxTEM大面积硅漂移探测器

牛津仪器X-MaxTEM大面积硅漂移探测器

报价

¥50万 - 60万

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牛津仪器

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型号

Ultim Max TLE

荣誉奖项

--

产地

欧洲

牛津仪器科技（上海）有限公司

白金
第23年
一般经销商

营业执照已审核

留言询价电话询价

核心参数

产地类别： 进口

仪器种类： 斜插式

能量分辨率： 125eV

峰背比： 200000:1

最大计数率： >200,000 cps

元素检测范围： Be-Cf

探测器面积： 80mm2

窗口类型： 无窗

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产品介绍相关方案售后服务承诺用户评论问商家

Ultim Max TEM，搭载于透射电子显微镜(TEM)主要用于纳米尺度成分分析和元素面分布分析。

全新设计80mm²的传感器，进一步接近样品并提供更多的x射线计数。UltimMax TEM结合了无窗设计和低噪音电子元器件 , 为 200kV下EDS分析提供高质量数据。

· 0.2 - 0.6 srad的立体角

· 对低能量x射线的灵敏度可提高8倍

· 可在400,000cps的计数率下进行定量分析

在原位实验中，可在1000°C的温度下采集谱图

旗舰款SDD传感器Ultim Max TLE，搭载于透射电子显微镜(TEM)，经过设计优化，提高了小束斑下的计数率，可表征原子尺度的元素信息。

这一性能是通过优化的晶体形状，100mm2大面积晶体，无窗结构，优化的机械设计和Extreme级电子元器件来实现的。

0.5 - 1.1srad的立体角
对低能量x射线的灵敏度可提高8倍
可在400,000cps的计数率下进行定量分析

在原位实验中，在高至1000°C的温度下采集谱图

Xplore TEM是专门为120kV和200kV 透射电镜（TEM）的常规应用而设计的元素分析系统。使用新的 80mm² 传感器和聚合物薄窗口及低噪音电子元器件 , 为用户提供快速和准确的元素表征。

0.1 - 0.4 srad的立体角
从Be到Cf的元素检测
可在200,000cps的计数率下进行定量分析

SATW窗口为广泛的应用提供了极大的便利性

相关方案

综合钢铁/金属地矿半导体

材料、塑料、胶黏剂中机械及电学性能检测方案(扫描探针)
For many materials, the truly important is how they perform and behave under the conditions that they are likely to be exposed to during their use-lifetime. This may be the application of stresses and strains in construction materials, the dielectric properties of ceramics or the corrosion resistance of materials as they are exposed to a variety of atmospheric conditions.
钢铁/金属 2019-07-31
矿物中化学分析检测方案(CMOS相机)
The economic viability of a mine can be determined by the microscopic characteristics of the ore, including the mineral abundance, the grain size and the degree of ore mineral liberation.
地矿 2019-07-31
材料中成分和结构检测方案(扫描探针)
Metals alloys and ceramics have a place in almost all of global manufacturing. Whether it is the turbine blades in a jet engine, the ceramic brake pads on a sports car or the steel cables for a suspension bridge, understanding the composition and structure of these materials is critical in understanding their properties.
钢铁/金属 2019-07-31
半导体中结构检测方案(EBSD系统)
Introduction Application Note As semiconductor devices continue to decrease in size to improve performance and take advantage of advances in fabrication techniques, there is a need to analyse both their structure and chemistry at ever increasing resolution. Typically this requires the use of TEM for metrology and failure analysis. Using ultrahigh resolution FEG-SEM, low kV imaging and the new X-Max® Extreme EDS detector we demonstrate the ability to retain some of this high resolution analysis in the SEM. This allows for better targeting of resources and increased throughput of analysis.
半导体 2018-01-08

材料、塑料、胶黏剂中机械及电学性能检测方案(扫描探针)
For many materials, the truly important is how they perform and behave under the conditions that they are likely to be exposed to during their use-lifetime. This may be the application of stresses and strains in construction materials, the dielectric properties of ceramics or the corrosion resistance of materials as they are exposed to a variety of atmospheric conditions.
钢铁/金属 2019-07-31
材料中成分和结构检测方案(扫描探针)
Metals alloys and ceramics have a place in almost all of global manufacturing. Whether it is the turbine blades in a jet engine, the ceramic brake pads on a sports car or the steel cables for a suspension bridge, understanding the composition and structure of these materials is critical in understanding their properties.
钢铁/金属 2019-07-31

矿物中化学分析检测方案(CMOS相机)
The economic viability of a mine can be determined by the microscopic characteristics of the ore, including the mineral abundance, the grain size and the degree of ore mineral liberation.
地矿 2019-07-31

半导体中结构检测方案(EBSD系统)
Introduction Application Note As semiconductor devices continue to decrease in size to improve performance and take advantage of advances in fabrication techniques, there is a need to analyse both their structure and chemistry at ever increasing resolution. Typically this requires the use of TEM for metrology and failure analysis. Using ultrahigh resolution FEG-SEM, low kV imaging and the new X-Max® Extreme EDS detector we demonstrate the ability to retain some of this high resolution analysis in the SEM. This allows for better targeting of resources and increased throughput of analysis.
半导体 2018-01-08

售后服务承诺

保修期: 详询工程师

是否可延长保修期: 是

现场技术咨询: 有

免费培训: 详询工程师

免费仪器保养: 详询工程师

保内维修承诺: 详询工程师

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牛津仪器X射线能谱仪Ultim Max TLE的工作原理介绍

X射线能谱仪Ultim Max TLE的使用方法?

牛津仪器Ultim Max TLE多少钱一台?

X射线能谱仪Ultim Max TLE可以检测什么？

X射线能谱仪Ultim Max TLE使用的注意事项？

牛津仪器Ultim Max TLE的说明书有吗？

牛津仪器X射线能谱仪Ultim Max TLE的操作规程有吗？

牛津仪器X射线能谱仪Ultim Max TLE报价含票含运吗？

牛津仪器Ultim Max TLE有现货吗？

牛津仪器X-MaxTEM大面积硅漂移探测器信息由牛津仪器科技（上海）有限公司为您提供，如您想了解更多关于牛津仪器X-MaxTEM大面积硅漂移探测器报价、型号、参数等信息，欢迎来电或留言咨询。

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