电镜专用微区成分分析---牛津仪器Xplore能谱仪
电镜专用微区成分分析---牛津仪器Xplore能谱仪
电镜专用微区成分分析---牛津仪器Xplore能谱仪
电镜专用微区成分分析---牛津仪器Xplore能谱仪

¥30万 - 40万

暂无评分

牛津仪器

暂无样本

Xplore15/Xplore30

欧洲

  • 白金
  • 第23年
  • 一般经销商
  • 营业执照已审核
400-860-2711
核心参数

产地类别: 进口

仪器种类: 斜插式

能量分辨率: 129eV@100,000cps

峰背比: 20,000:1

最大计数率: 1,000,000cps

元素检测范围: B-Cf

探测器面积: 有效晶体面积15m㎡或30m㎡

窗口类型: SATW

XploreSEM常规分析所用新一代EDS探测器。探测器有效晶体面积为15/30mm2 ,应用范围广泛。

Xplore使用了Ultim Max探测器中诸多新技术,它提供了实时EDS分析所需的快速数据采集,同时保证了常规分析所需的自动可靠的结果。

速度

Extreme电路与X1脉冲处理器的结合使Xplore能够以1,000,000 cps的计数率进行面分布分析,并以100,000 cps的速度进行准确定量分析

灵敏度

新的紧凑型设计使得探测器体积小巧且便于现场维修,更大限度地延长工作时间并减少宕机时间

Extreme电路

Xplore结合了先进的Extreme电路,提供尽可能低的噪音信号检测和处理。确保在高计数率下获得优异的能量分辨率和谱图质量,保证在100,000 cps下获得129eV Mn Kα分辨率


相关方案

  • Introduction In Transmission Electron Microscopy (TEM) there are two ‘go to’ techniques for elemental analysis: Energy Dispersive X-ray Spectroscopy, (EDS), and Electron Energy Loss Spectroscopy, (EELS). EDS is a mature technique that can be used for most specimens. The intensity of generated X-rays is proportional to the mass thickness of the sample. However, this can become a limitation for very thin specimens or those comprising light elements. On the other hand, EELS is more suitable for thin samples where the thickness is less than the inelastic mean free path of electrons in the material. EELS does, however, give high signal to noise for light elements. Simultaneous acquisition of both signals is a powerful tool for materials analysis.

    半导体 2020-06-15

  • Introduction In Transmission Electron Microscopy (TEM) there are two ‘go to’ techniques for elemental analysis: Energy Dispersive X-ray Spectroscopy, (EDS), and Electron Energy Loss Spectroscopy, (EELS). EDS is a mature technique that can be used for most specimens. The intensity of generated X-rays is proportional to the mass thickness of the sample. However, this can become a limitation for very thin specimens or those comprising light elements. On the other hand, EELS is more suitable for thin samples where the thickness is less than the inelastic mean free path of electrons in the material. EELS does, however, give high signal to noise for light elements. Simultaneous acquisition of both signals is a powerful tool for materials analysis.

    半导体 2020-06-15

售后服务承诺

保修期: 详询工程师

是否可延长保修期:

现场技术咨询:

免费培训: 详询工程师

免费仪器保养: 详询工程师

保内维修承诺: 详询工程师

报修承诺: 详询工程师

用户评论
暂无评论
问商家

牛津仪器X射线能谱仪Xplore15/Xplore30的工作原理介绍

X射线能谱仪Xplore15/Xplore30的使用方法?

牛津仪器Xplore15/Xplore30多少钱一台?

X射线能谱仪Xplore15/Xplore30可以检测什么?

X射线能谱仪Xplore15/Xplore30使用的注意事项?

牛津仪器Xplore15/Xplore30的说明书有吗?

牛津仪器X射线能谱仪Xplore15/Xplore30的操作规程有吗?

牛津仪器X射线能谱仪Xplore15/Xplore30报价含票含运吗?

牛津仪器Xplore15/Xplore30有现货吗?

电镜专用微区成分分析---牛津仪器Xplore能谱仪信息由牛津仪器科技(上海)有限公司为您提供,如您想了解更多关于电镜专用微区成分分析---牛津仪器Xplore能谱仪报价、型号、参数等信息,牛津仪器客服电话:400-860-2711,欢迎来电或留言咨询。
移动端

仪器信息网App

返回顶部
仪器对比

最多添加5台