布鲁克平插式能谱仪FlatQUAD

报价

¥60万 - 100万

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品牌

布鲁克

样本

暂无样本

型号

QUANTAX FlatQUAD

荣誉奖项

产地

欧洲

布鲁克电子显微纳米分析仪器部

金牌
第7年
一般经销商

营业执照已审核

留言询价电话询价

核心参数

产地类别： 进口

能量分辨率： <129 eV

峰背比： 20000:1

最大计数率： 4000 kcps

元素检测范围： B-Cf

探测器面积： 10-300 mm²

窗口类型： 无窗

相关方案

综合地矿钢铁/金属

不锈钢中元素含量检测方案(电镜部件)
Using Bruker’s Hysitron PI 88 SEM PicoIndenter equipped with tilt and rotation stages in conjunction with the QUANTAX EBSD system enables a more robust characterization of metallic materials by combining high resolution phase and grain orientation mapping capabilities with targeted nanomechanical property measurements. This combination could also be used to extend the scope of research related to other advanced textured, anisotropic, or multi-phase materials.
钢铁/金属 2021-09-02
陨石中元素含量检测方案(电镜部件)
Non-destructive sample analysis with high spatial resolution can be very difficult to accomplish using conventional EDS detectors as sample surface charging, electron beam damage and shading effects by topography are common problems in scanning electron microscopy. The BRUKER XFlash® FlatQUAD silicon drift detector (SDD) overcomes these limitations. The special geometry with an annular arrangement of detector elements offers a very high solid angle [1]. The XFlash® FlatQUAD detector allows the use of ultra-low beam currents and the investigation of samples with complex topography as demonstrated on two meteorite fall samples.
地矿 2021-09-02

陨石中元素含量检测方案(电镜部件)
Non-destructive sample analysis with high spatial resolution can be very difficult to accomplish using conventional EDS detectors as sample surface charging, electron beam damage and shading effects by topography are common problems in scanning electron microscopy. The BRUKER XFlash® FlatQUAD silicon drift detector (SDD) overcomes these limitations. The special geometry with an annular arrangement of detector elements offers a very high solid angle [1]. The XFlash® FlatQUAD detector allows the use of ultra-low beam currents and the investigation of samples with complex topography as demonstrated on two meteorite fall samples.
地矿 2021-09-02

不锈钢中元素含量检测方案(电镜部件)
Using Bruker’s Hysitron PI 88 SEM PicoIndenter equipped with tilt and rotation stages in conjunction with the QUANTAX EBSD system enables a more robust characterization of metallic materials by combining high resolution phase and grain orientation mapping capabilities with targeted nanomechanical property measurements. This combination could also be used to extend the scope of research related to other advanced textured, anisotropic, or multi-phase materials.
钢铁/金属 2021-09-02

售后服务承诺

保修期: 1年

是否可延长保修期: 是

现场技术咨询: 有

免费培训: 一次安装使用培训，不限次数应用培训

免费仪器保养: 基本仪器使用保养指导并现场服务

保内维修承诺: 所有服务及配件（人为损坏及消耗品除外）全部免费

报修承诺: 24小时内电话指导，48小时内现场服务

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布鲁克X射线能谱仪QUANTAX FlatQUAD的工作原理介绍

X射线能谱仪QUANTAX FlatQUAD的使用方法?

布鲁克QUANTAX FlatQUAD多少钱一台?

X射线能谱仪QUANTAX FlatQUAD可以检测什么？

X射线能谱仪QUANTAX FlatQUAD使用的注意事项？

布鲁克QUANTAX FlatQUAD的说明书有吗？

布鲁克X射线能谱仪QUANTAX FlatQUAD的操作规程有吗？

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