Period: 292nm pitch nominal, one dimensional array. Accuracy is +/- 1%. Calibration certificate will give the actual pitch of the standard.
Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated.
Usability: The calibrated pattern covers the entire chip. There is sufficient usable area to make tens of thousands of measurementswithout reusing any areas contaminated or altered by previous scans.
AFM: Use in contact, tapping and other modes with image sizes from 500nm to 20um. Mounted on a 12mm steel AFM disk.
SEM, Auger, FIB: Can be used for a wide range of accelerating voltage (<1kV-30kV) and calibrates images from 5kX to 200kX. Can be supplied unmounted or mounted on an SEM stub of your choice.
Certification: There is a version with a non-traceable manufacturer’s certificate stating average pitch, based on batch measurements.
There is also the traceable, certified version measured in comparison with a standard calibrated at PTB (Physiklisch-Technischen Bundesanstalt in Braunschweig, Germany, is the German counterpart of NIST). The standard is NIST traceable by virtue of the mutual recognition agreement by NIST and PTB.
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企业名称
广州竞赢科学仪器有限公司
企业信息已认证
企业类型
信用代码
91440101MA59JWR743
成立日期
2017-03-02
注册资本
100
经营范围
广州竞赢科学仪器有限公司(简称竞赢科仪)成立于2017年,是一家专业的分析测试解决方案提供商,业务范围包括分析测试技术方法开发,设备研制、生产和销售,实验室组建,测试服务、科研服务等。公司在司法鉴定领域具有深厚的技术积累,尤其在法医学硅藻检验和微量物证理化检验方面保持技术领先水平。
广州竞赢科学仪器有限公司
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广东省广州市天河区燕岭路25号1009
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