magnification calibration image distortion check; SEM, LM
Single crystal silicon, 5mm x 5mm. The squares repeat every 10µm (0.01mm). The dividing lines are about 1.9µm wide, formed by electron beam lithography. A broader marking line is written every 500µm (0.5mm) which is useful for light microscopy. Squares are etched, and approximately 200nm deep. Available unmounted or mounted on SEM specimen mounts.
Many types of samples can be mounted directly onto the Silicon Test Specimen so that an internal calibration is obtained on the micrograph.
To avoid contamination of test and calibration samples, we recommend storing these under vacuum. For the standard SEM pin mounts, the #16179 PELCO® SEM Sample Stub Vacuum Desiccator would be ideal.
A certificate of calibration can be supplied for the Silicon Test Specimen at extra cost. The guaranteed accuracy is 1%. The basic reference specimen is calibrated by the National Physical Laboratory, of England, by laser beam interferometry.
硅测试标样由广州竟赢仪器有限公司为您提供,货号615,规格:5mm x 5mm,CAS号:,如您想了解更多关于硅测试标样价格、硅测试标样结构式、批发、用途等信息,欢迎咨询。除供应硅测试标样外,还可为您提供高分辨率测试标样、栅格标样、AFM XYZ校准标样等试剂,公司有专业的客户服务团队,是您值得信赖的合作伙伴,竞赢科学客户服务电话,售前、售后均可联系。