LaVision ParticleMaster-IMI 干涉米氏粒径测量

报价

¥80万 - 100万

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品牌

LaVision GmbH

样本

下载

型号

ParticleMaster-IMI

荣誉奖项

产地

欧洲

北京欧兰科技发展有限公司

金牌
第17年
一般经销商

营业执照已审核

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核心参数

Interferometric Mie Imaging

LaVision’s ParticleMaster IMI imaging system is optimized for spray investigations of smaller droplets at low and medium droplet densities. Defocused Mie scattering is used to generate a fringe pattern from each droplet with its fringe spacing related to the droplet size. This intererometric sizing method is limited to transparent and spherical droplets. The ParticleMaster IMI system is hardware compatible with LaVision’s FlowMaster 2D or Stereo PIV systems.

ParticleMaster IMI

System Features

autodetection with droplet location from a single camera
droplet size from fringe pattern analysis
droplet velocity derived from double frame exposures
velocity - size correlations, histograms, scatterplots

Principle of IMI droplet sizing

Shadowgraphy vs. Interferometric Mie Imaging

Both, ParticleMaster Shadow and IMI are based on imaging techniques to measure particle size. Their limit to smaller size is determined by the nature of light. While the shadowgraphy technique uses a direct image, IMI is based on coherent light scattering and allows to extend the range of detectable droplets to even smaller sizes.

ParticleMaster
Application Matrix

Product Information

ParticleMaster

相关仪器相关资料

DaVis-PIV系统图像数据采集和硬件控制的集成软件平台

DaVis是德国LaVsion公司推出的应用于反应和非反应流场测量，材料表面成像和追迹以及超快成像的智能（激光）成像技术的完整软件平台。 DaVis以灵活的图像采集模块，可用户定制的应用界面和特殊应用软件包三大特色功能成就了完美的成像系统所需软件。 DaVis软件可满足用户以纳秒量级的精度进行相机曝光，外部照明以及外部触发的同步控制并能自由选择采集图像序列。除此之外，DaVis软件拥有各种成像设置和控制的功能。 DaVis软件对用户开放，这种特色结合软件本身的宏命令语言，能够使得成像系统快速适应从高深的科学研究到可靠的工业应用等各种不同测量需求。不仅如此，DaVis还拥有灵活的图像采集模式，先进的图像处理算法，多维图像数据的智能存储和显示，多种硬件的软件控制等功能。集成了2DPIV和3DPIV功能模块的DaVis软件，参加了连续三年的PIVChallenge（http://www.pivchallenge.org）评测活动，均取得了优异成绩。客观证明了DaVis软件平台的出色性能。 PIVChallenge的组织者将两次PIVChallenge 活动的结果作了详尽的总结，并将结果发表在了公开的网站和杂志上。有关文章和下载网址如下： 1. Stanislas M, Okamoto K, Kaehler C (2003) Main results of the First International PIV Challenge. Meas Sci Technol 14:R63-R89 下载地址： http://stacks.iop.org/0957-0233/14/R63 或： http://www.oplanchina.com/download/Stanislas PIV challenge 2001.pdf 2. Stanislas M, Okamoto K, Kaehler C, Westerweel J (2005) Main results of the Second International PIV Challenge. Exp Fluids 39: 170-191 下载地址：http://www.oplanchina.com/download/PIV Challenge 2003 Results.pdf

2171MB 2008-01-19