Step heights of 20, 100 or 500nm.
The HS-series calibration standards offers an easy and reliable way to calibrate AFM systems. Primarily designed for accurate Z-axis calibration the standards also offer X- and Y-axis calibration for bigger scanners in the 40-100um range. The structure symmetry enables calibration without the need to rotate and re-align the sample in between x- and Y-axis calibration.
The HS-series feature silicondioxide structure arrays on a 5x5mm silicon chip. The fabrication process ensures excellent uniformity of the structures across the chip. There are three step heights available with nominal values of: 20nm, 100nm, and 500nm. The actual value will be supplied with the delivered calibration standard. Arrays of structures with different shape and pitch are integrated on the chip. The larger square of 1 x 1mm contains square pillars and holes with a 10um pitch. The smaller center square of 500 x 500µm contains circular pillars and holes as well as lines in both X- and Y-direction with a 5um pitch.
The silicon chips are available unmounted or mounted on a 12mm standard AFM disc using a high quality electrically conductive epoxy.
AFM校准标样由广州竞赢科学仪器有限公司为您提供,货号HS-20MG,规格:20, 100 or 500nm,CAS号:,如您想了解更多关于AFM校准标样价格、AFM校准标样结构式、批发、用途等信息,欢迎咨询。除供应AFM校准标样外,还可为您提供高分辨率2D校准标样、散光校准标样、纳米金分辨率测试标样等试剂,公司有专业的客户服务团队,是您值得信赖的合作伙伴,竞赢科学客户服务电话,售前、售后均可联系。