Colloidal cobalt provides an excellent substrate for AFM tip characterization and instrument operation. Image at top demonstrates height calibration at 1nm (red line profile) and 3nm (green line profile) on the standard.
Available on 5x5mm silicon wafer chips unmounted or mounted on 12mm stainless steel metal disk. Tip characterization down to angstrom resolution is easily attained. Image at top demonstrates 1 and 3nm height resolution accurate to 0.05nm.
测试标样由广州竞赢科学仪器有限公司为您提供,货号628,规格:resolution accurate to 0.05nm,CAS号:,如您想了解更多关于测试标样价格、测试标样结构式、批发、用途等信息,欢迎咨询。除供应测试标样外,还可为您提供低放大倍数测试标样、散光校准标样、分辨率测试标样等试剂,公司有专业的客户服务团队,是您值得信赖的合作伙伴,竞赢科学客户服务电话,售前、售后均可联系。