布鲁克 平插式能谱仪FlatQUAD

Using Bruker’s Hysitron PI 88 SEM PicoIndenter equipped with tilt and rotation stages in conjunction with the QUANTAX EBSD system enables a more robust characterization of metallic materials by combining high resolution phase and grain orientation mapping capabilities with targeted nanomechanical property measurements. This combination could also be used to extend the scope of research related to other advanced textured, anisotropic, or multi-phase materials.

Non-destructive sample analysis with high spatial resolution can be very difficult to accomplish using conventional EDS detectors as sample surface charging, electron beam damage and shading effects by topography are common problems in scanning electron microscopy. The BRUKER XFlash® FlatQUAD silicon drift detector (SDD) overcomes these limitations. The special geometry with an annular arrangement of detector elements offers a very high solid angle [1]. The XFlash® FlatQUAD detector allows the use of ultra-low beam currents and the investigation of samples with complex topography as demonstrated on two meteorite fall samples.