离子迁移谱技术用于痕量正硅酸四甲酯(TMOS)检测

The ion mobility spectrometry technique offers advantages like high sensitivity (ppb range), fast response (ms range), compact design, operation in atmospheric pressure and ability to separate the isomeric compounds. In this short report we demonstrate the sensitivity and fast response of IMS technique at low ppb level. As a case compound was chosen Tetramethyl Orthosilicate TMOS

离子迁移谱技术具有灵敏度高（ppb范围）、响应速度快（ms范围）、设计紧凑、在亚大气压下工作以及能够分离异构体等优点。在这篇简短的报告中，我们展示了PAIMS技术在低ppb水平下的灵敏度和快速响应。作为一个案例化合物选择四甲基正硅酸TMOS

The TMOS Si(OCH3)4 of molar mass 152.25 g/mol, is frequently used in in organic synthesis . The TMOS at low concentrations inhalation causes lung lesions, and at slightly higher concentrations eye contact with the vapor causes blindness. Due to this reasons is monitoring of TMOS in low concentration required especial in clean industrial hall where it is frequently used.

TMOS-Si（OCH3）4分子量为152.25g/mol，是有机合成中常用的化合物。吸入低浓度TMOS会导致肺部损伤，而稍高浓度时，眼睛接触蒸汽会导致失明。因此，需要对低浓度的TMOS进行监测，特别是在洁净车间中经常使用。

In this short Laboratory Report we demonstrate the ability of Ion Mobility Spectrometer operated in sub-atmospheric pressure for continuous monitoring of TMOS at low ppb level.

在这份简短的实验室报告中，我们展示了大气压下运行的离子迁移谱仪在低ppb水平下连续监测TMOS的能力。