QE（大小光斑带Mapping功能）量子效率测量

QE（大小光斑带mapping功能）量子效率测量；

Spectral Response, QE,IPCE system

Overview

The PVE300 system is a monolithic, turnkey solution forphotovoltaic device research in industry and academia, permitting the quick andaccurate characterisation of photovoltaic devices and materials.

Backed by Bentham’s extensive experience in thefield of light measurement, this system can be configured to cover the spectralrange and device type of your choice.

Features

Absolute spectral Responsively, External QuantumEfficiency measurement; Incident Photon to Charge Carrier Efficiency (IPCE)measurement; Integrating sphere-based determination of reflectance/transmittance to yield internal quantum efficiency (IQE, %)

All Type of Solar Cell, Silicon, Ge, CdTe, CIS,Organic, Dye-sensitized; Single or Multi-junction devices (with Bias lightoption); Spectral range 300 --- 1100nm; Optional Extension to 1800nm Testingunder variable bias light, Bias light intensity up to one sun illumination