真空紫外（VUV）分光光度计

技术参数：
In consideration of the presently available experience with several set ups constructed for research institutes and industrial companies, the following specifications can be expected (deuterium lamp with low operation time):

波长范围 115 nm 至 230 nm 单灯
115 nm 至 230 nm 加 160 nm 至 320 nm，双灯
光谱分辨率 < 1 nm （160nm 谱线的半高全宽度FWHM ）
重现性 < 0.1 nm，在160 nm 和 121.5 nm 处获得验证
工作压力 < 1×10-5 毫巴。实践证明这是测量的最佳值

测量精度
透过率 <0.3%
反射率 <0.5%
Transmittance out of band <0.1%
Scattered Reflectance >0.001% 157nm
Reproducability
157nm
Diffuse Reflectance <5% 157nm
Scattered Reflectance <5% 157nm
(@ aperture of 1mm in front of PMT , wavelength dependent



主要特点：
The UV/VUV - spectrophotometer system is a product of more than twenty years of research in the field of production and testing of advanced optical components for UV/VUV spectral range. The current system is based on a prototype spectrophotometer of the Laser Zentrum Hannover e.V., which was initially developed for typical analytical tasks in optical thin film technology. During the production phase of more than ten units for industrial companies and research institutes, the measurement performance of the system could be improved to an outstanding level, which qualifies the spectrophotometer in routine quality management and research applications.