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Ekspla SFG 表面和频光谱分析系统
Ekspla SFG 表面和频光谱分析系统
Ekspla SFG 表面和频光谱分析系统
Ekspla SFG 表面和频光谱分析系统
Ekspla SFG 表面和频光谱分析系统
Ekspla SFG 表面和频光谱分析系统
Ekspla SFG 表面和频光谱分析系统
Ekspla SFG 表面和频光谱分析系统
Ekspla SFG 表面和频光谱分析系统
Ekspla SFG 表面和频光谱分析系统

Ekspla SFG 表面和频光谱分析系统

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北京欧兰科技发展有限公司
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仪器简介：

SFG系统是进行表面和接触面研究的强有力而通用的工具

应用 
聚合物分子结构, 聚合物混合表面与深层接触面 
电化电池的固体/液体表面分子组织研究 
晶体表面催化反应的分子研究 
液体表面的分子定向研究，特别是水表面 
金属单层的自聚合现象研究 
... 还有您的个性化课题。

SFG 和频光谱测量系统 
和频光谱测量系统 (SFG)是一个二阶非线性光学测量过程，用于在接触面产生分子振动光谱。 
SFG,一种三束光波混频过程。通过将红外光，可见光在样品上（在时间和空间）上重合产生合频信号(wSF = wIR + wVIS) 
由于其表面特异性，SFG信号只能来源于表面分子或原子. 其特点是表面分子的灵敏性和特异性 
几乎在任何可以接触光的表面都可以应用SFG这一无破坏性的光学技术。测量可以在各种环境，包括真空和大压力条件下进行。  

技术参数：

总体性能
工作波长：2.3–10μm(4300–1000cm-1)*
光谱分辨率：< 6 cm-1
检波灵敏度：~10 photons/shot
数据采集频率：10 Hz
*) 可选择使用 16 &mu;m (625 cm-1)

可见光束（VIS beam）：
波长：532 nm
线宽：< 2 cm-1
脉冲能量：~ 1 mJ @532 nm
脉冲持续时间：20 &ndash; 30 ps
偏振
线性; 可选择;
偏振度>1:100

红外光束（IR beam）
调谐范围：2.3&ndash;10 &mu;m(4300&ndash;1000 cm-1)*
线宽：< 6 cm-1
偏振：线性; 可选; 1:100 纯度
脉冲能量：200-20&mu;J

SFG光束：
波长范围：432 &ndash; 505 nm (VIS 光束=532 nm)


主要特点：

性能特点：
优良的激光源稳定性，S/N率高
测量范围大： 625 cm-1
光谱分辨率高于 6 cm-1
性价比高
完全 PC 控制波长扫描
可升级到SHG倍频光谱测量系统
在线分析研究
单层分子研究
端基定向
表面反应与催化
表面原子团完全定向
表面震动的激发与缓和

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    Stability of the Si-H bonds on the hydrogen-terminated Si(111) surface has been investigated by sum frequency generation (SFG) spectroscopy in air at room temperature. The SFG observation showed that the Si(111) surface is terminated by a monolayer of monohydride (Si-H) after etching in a concertrated ammonium fluoride (NH4F) solution. The number of Si-H bonds decreased with laser irradiation time and the abstraction rate of hydrogen atoms on Si increased with the increase of input energy of "visible" light. The Si-H bond under irradiation at 1064nm light was more stable than that at 532nm light with a given intensity. A small amount of water in air severely lowered the stability of Si-H bond because of a photoelectrochemical recation under laser irradiation.

    其他 2008-05-11

  • 金/溶液界面,十八烷基硫醇,单分子层膜构象中SFG光谱,和频光谱检测方案(其它光谱仪)
    Sum frequency generation (SFG) spectroscopy using internal reflection geometry was employed to investigate the conformational order of octadecanethiol (ODT) monolayer on gold thin films in an electrolyte solution. This approach is convinced to be useful to study the molecular structure on the electrode/solution interface under electrochemical condition.

    石油/化工 2008-05-07

  • 丙酮,水,液体混合,吉布斯表面,吸附层,结构和能级中和频光谱,分子能级,表面特性,分子光谱检测方案(其它光谱仪)
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    其他 2008-05-05

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    石油/化工 2008-04-26

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    环保 2019-03-13

  • 水,室温离子液体,表面阳离子取向中振动和频发生光谱学研究,SFG光谱,和频光谱检测方案(其它光谱仪)
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  • 矿物/水界面中表面和频光谱（SFG)检测方案(其它光谱仪)
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    环保 2008-05-01

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