多功能扫描探针显微镜（纳米力学测试）

如有需要请通过伯英科技联系我们。

多功能扫描探针显微镜（带纳米力学测试功能）型号：NT-206，是集多功能于一身的原子力显微镜，带有复杂的硬件与软件分析系统，可分析形貌与力学性能，分辨率为纳米级别。可添加：纳米压痕、划痕、磨损，附着力、摩擦力测试，纳米光刻等功能。

A probe is positioned above journal neck of watch gear

Embedded videosystem in combination with motorized XY micropositioning stage provide convenient tuning of the instrument and its fine targeting onto the features on the sample surface. All that dramatically enhances the instrument's functionality when researching micro- and nanosize objects.

To meet requirements of specific research tasks, AFM NT-206 can include specialized changeable probe holders for microtribometry and adhesiometry or for nanoindentation.

NT-206 ::: Description ::: Features ::: Delivery set ::: Software 

多功能扫描探针显微镜（带纳米力学测试功能）技术指标：

     * Before measurements, the probe can be positioned to necessary place over the sample with help of automated motorized stage. To provide monitoring for the scan area and objects below the probe, the instrument embeds a videosystem allowing to watch the probe motion over the sample surface. Videosystem and the motorized stage for the probe positioning over sample are included in base set by default. A combination of these two options allows rather flexible selection of objects to be measured on the sample surface at direct visual monitoring by the opeartor.

多功能扫描探针显微镜（带纳米力学测试功能）组成模块： 

DELIVERY SET

NT-206 ::: Description ::: Features ::: Delivery set ::: Software

::: BASIC SET
	Scanning unit (atomic force microscope) Includes a base platform with embedded XY positioning stage and a detachable measuring head with integrated video system
	Control electronic unit  with the connetcion cables in the set  (the case variants)
	Software package including: The software runs under Win32. Supplied on CD. Updates available at this site in section ARCHIVE > SOFTWAREAFM control software SurfaceScan for driving complex and data acqusition and visualization .SurfaceView and SurfaceXplorersoftware package for the measured data processing, visualization and analysis.The software can include plug-ins for processing AFM-data obtained with other microscopes.A set of drivers for connection of control electronic unit with host PC and running videosystem.
Note: 1 Base set includes also the control software (for Win32) and user manual. 多功能扫描探针显微镜（带纳米力学测试功能）可选配件
::: ADDITIONAL ACCESSORIES (optional)
	A specialized antivibration rack		A changeable probe holder
	Changeable scaners for ranges:  5x5x2 um 10x10x3 um 20x20x3.5 um 40x40x3.5 um 50x50x3.5 um 90x90x3.5 um		Set for scanning the sample emmersed in liquid medium
	Thermocell: a changeable sample platform for measured sample heating up to 150 °С with stand-allone controller		A changeable holder for conducting probes
	Extending block insert allowing measurement of thick samples with height up to 35 mm		A changeable microtribometer-adhesiometer unit
	Option: a set of AFM probes (Prod. by Mikromasch)		A changeable shear-force microtribometer unit
	Option: a set of calibration test gratings (Prod. by Mikromasch)		A changeable nanoindentor unit

多功能扫描探针显微镜（带纳米力学测试功能）软件 

SOFTWARE

NT-206 ::: Description ::: Features ::: Delivery set ::: Software

Control software for AFM NT-206 SurfaceScan is a 32-bit Windows application. 
It runs under Windows XPsp2/Vista/7 operating systems.

The control software provides all preliminary tunings and settings necessary for the AFM operation: visual control over the laser-beam detection system adjustment, tuning of the cantilever oscillations (in dynamic modes), feed-back system adjusting, sample positioning under the probe and sample approach to the probe before measurements and removal after the measurements. A full-field or any reduced area within the full field of the scanner can be selected for measurements.

Operator can watch any combination of acquired AFM/LFM images in data visualization window or switch to look at them in one window. Additionally, profile of currenly acquired line can be monitored as well.

Acquired data are saved in files of special format that can be then processed, visualised (in 2-D and 3-D presentation) and analysed with a specialized software package SurfaceView or SurfaceXplorer.