Period: 300nm pitch nominal, one dimensional array. Calibration certificate will give the actual pitch of the standard.
Surface Structure: Aluminum bumps on Silicon, 4x3mm die: Bump height (about 50nm) and width (about 150nm) not calibrated.
Usability: The calibrated pattern covers the entire chip. There is sufficient usable area to make thousands of measurements without reusing any areas contaminated or altered by previous scans.
AFM: Use in contact, tapping and other modes with image sizes from 500nm to 20nm. Mounted on a 12mm steel AFM disk.
SEM: Auger, FIB: Can be used for a wide range of accelerating voltage (1kV-20kV) and calibrates images from 5kX to 200kX. Can be supplied unmounted or mounted on an SEM stub of your choice. SEM Mount selection A-P.
Certification: Supplied with a non-traceable manufacturer's certificate stating average pitch, based on batch measurements
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企业名称
广州竞赢化工科技有限公司
企业信息已认证
企业类型
有限责任公司(自然人投资或控股)
信用代码
91440101795540632T
成立日期
2006-12-11
注册资本
壹佰零捌万元整
经营范围
科技推广和应用服务业(具体经营项目请登录广州市商事主体信息公示平台查询。依法须经批准的项目,经相关部门批准后方可开展经营活动.)
广州竞赢有限公司
公司地址
广州市天河区燕岭路25号1009室
客服电话