片式多层陶瓷电容器（MLCC）具有性能极好、品种众多、规格齐全、尺寸小巧、价格便宜等特点，被广泛用于各种电路。本文将介绍如何对其进行金相制备。

电子产品在我们生活中扮演着重要的角色。我们每天使用的手机、数码相机、汽车和电脑中都存在柔性电路板。现在的FPC基本都使用聚酰亚胺或聚酯薄膜为基材。聚酰亚胺材料具有非易燃性，几何尺寸稳定，具有较高的抗拉强度，并且具有承受焊接温度的能力，是几乎所有芯片的首选材料。

随着节能环保等理念的推进，功率器件在市场上越来越多见；IGBT 是能源变换与传输的核心器件，俗称电力电子装置的“CPU”，作为国家战略性新兴产业，在轨道交通、智能电网、航空航天、电动汽车与新能源装备等领域应用极广。IGBT 模块具有节能、安装维修方便、散热稳定等特点；当前市场上销售的多为此类模块化产品，一般所说的 IGBT也指IGBT模块。

为达到质量控制或失效分析目的对电子元件进行切割是具有挑战性的，因为必须确保不受制备引起的假象影响，显示出样品真实的结构。 不恰当的切割方式对样品有高度破坏性，可能会导致假象，很容易被误解为生产缺陷。为了避免这种情况，需要在远离感兴趣区域（ROI）的地方进行切割，并且需要长时间的研磨和抛光阶段来恢复切割造成的损伤。

焊点是微电子封装的重要组成部分，因其既可用作机械互连，也可用作电气互连。在过去，电子部件连接到印刷线路板的铜端子所用的焊料由锡和铅的合金制成，后来出于对铅造成的安全和环境污染方面的担忧，人们提出使用无铅合金，包括Sn-Ag和Sn-Cu等。 在微电子行业和失效分析实验室，这类材料的抛光相对比较困难，通常需要很长时间才能获得较好的抛光面。焊点的评估和可靠性测试通常广泛应用于失效分析和显微结构研究。 本文的目的在于为无铅焊料的金相分析开发一种有效的试样制备方法。对四种不同的焊料合金进行了光学偏振光显微镜测试和SEM分析，包括SnCu、SN100C、SAC305和Kester的新型合金K100LD（SnCu与Ni和Bi微合金化）。

随着电子技术在各应用领域的逐步加深，半导体正沿着大功率化、高频化、集成化方向发展，高度的集成化封装模块要求良好的散热承载系统，而传统线路板FR-4导热系数上的劣势已经成为制约电子技术发展的一个瓶颈。近些年来发展迅猛的LED产业，也对其承载线路板的导热系数指标提出了更高的要求。陶瓷基板材料以其强度高、绝缘性好、导热和耐热性能优良、热膨胀系数小、化学稳定性好等优点，广泛应用于电子封装基板。

电子学是工程学的一个重要分支, 它是一门关于为了有用的目的而对电子进行控制的学科。运用物理学的知识得知, 电子的流动可以在真空、气体、或液体中进行，也可以在固体中受限制地流动（半导体）、接近不受限制地流动（导体）、或完全不受限制地流动（超导体）。 当今, 电子产品正变得越来越复杂，工程技术人员总是力图将许多部件放在一个小小的“黑匣子”中。制造商总是想把大部分资金用在改善其生产设施，而只愿意留下很少一部分资金用于质量控制。最坏的情况是，大多数公司宁愿把他们的质量控制资金用于基本设备投资，例如购买新型扫描电子显微镜、透射电子显微镜，或是厄歇谱仪，只剩下很少一部分钱用来购买试样制备设备和消耗器材。一个众所周知的现象就是人们对试样制备的重要性一直不够重视。 另一方面, 毫无疑问，最终产品的质量和可靠性取决于每个部件的性能。然而，这也总是电子工业的一个令人头痛的问题。对电子产品的截面进行金相检验是一种众所周知并通常广为接受的检验方法。 然而，大多数电子产品的金相技术人员可能面临的一个问题就是他们需要进行磨光和抛光的材料比预期的复杂和困难。他们也许从来没有学习过如何去处理多层基体材料，而他们在大学学习时只学过如何恰当地制备均匀的材料，例如钢、铜合金或铝合金。此外，他们还须面对设备很差的金相实验室，消耗器材的品种也很有限，并且使用所谓的“传统或常规方法”来制备先进的电子产品试样。 一般情况下，常规试样制备方法是从240#碳化硅砂纸开始，先进行磨成平面工序，接着使用600#、1200#砂纸，然后用0.3 ?m 氧化铝进行粗抛光，以及0.05 ?m 氧化铝在长绒毛织物上进行最终抛光，这样可获得光亮的表面。制备方法还可能因地而异，甚至还取决于实验室有哪些现成的消耗器材。当今，这种制备方法已经不适于用来制备先进材料。此外，他们也没有想到他们的试样是否好到足以和先进的显微镜或扫描电子显微镜相匹配。 在本文中，我们试图给出各种集成电路（IC）封装、引线连接，以及其它部件的试样制备方法。

Microelectronics, Part I: Cutting, Mounting Written by: Scott Holt,Applications Engineer,Buehler Editor:George Vander VoortDirector, Research and Technology, Buehler Introduction For most microelectronic devices and packages, direct microscopic observation of a cross section is an important means of inspecting a particular defect. The creation of a cross section, as a destructive measure, is often used in the microelectronics lab as a decisive and final inspection tool after all other economical means of nondestructive inspection are employed. In order to produce a cross section, many of the techniques used in the metals industry have been borrowed; to a large degree, with success. However, the philosophy and logic for choosing a particular method of cutting, mounting, and abrasive preparation has often been lost in the process. This is of extreme significance because the needs of the microelectronics industry vary greatly from those of the metals industry. Issues such as feature size, specific area cross sectioning, and the ability to prepare a variety of materials with different mechanical properties within a single plane of polish require an understanding of basic abrasive processes so that appropriate sectioning methods might be developed. This issue of TECH-NOTES is the first half of a two part effort to summarize some of the basic concepts involved in proper preparation of microelectronic materials. We will discuss some simple guidelines which the microelectronic materials analyst might draw upon in the development of better preparation techniques. In particular, this issue will cover the variables involved in cutting and mounting of microelectronic materials, and summarize some of the technique and consumable choices that must be considered in order to achieve quality results. The next microelectronics issue of TECH-NOTES will continue with the abrasive processes of grinding and polishing these materials.

Microsectioning has become a standard requirement of printed wiring board (PWB) quality assurance due to the potential for hidden, subsurface defects, and for process control. In recent years, increasing numbers of PWB customers have begun to require certified vendors to perform statistical sampling of their product. Cost reduction initiatives are the driving forces which have shifted this responsibility to the vendor. Many wiring board manufacturers, however, are unprepared for this shift. Their microsectioning capabilities remain manual in nature, and they are poorly equipped to handle the volume of coupon cross-sectioning necessary to meet their customer’s requirements. Often, all that is needed is a small investment in microsectioning automation, but the perceived costs keep many PWB production houses from taking this critical step. In addition, many are fearful that automation will result in loss of jobs. While it is true that automation will free significant amounts of time for workers to focus on other efforts, it does not eliminate the need for operators altogether. This paper offers a look at manual and automated microsectioning of PWB’s, with the purpose of illustrating the time and cost benefits of automation.