2D 材料三碘化铬是一种高磁导率的铁磁材料，我们主要研究它的磁激发特性。在研究过程中，我们 发现了太赫兹频率的自旋波，它的频率比传统铁磁材料高得多，这将为制造超快自旋电子器件开辟新机会 。

研究人员先采用低温溶液法，制备出无铅金属卤化物 Cs3Cu2I5薄膜，发现该无铅钙钛矿膜具有良好的结晶质量， 对紫外光也有良好的吸收 。

史教授团队将CsCu2I3薄膜作为发光层，进一步制备出基于无铅铜基卤化物薄膜的电致发光 LED 。然后利用HORIBA 荧光仪器对LED器件进行发光效率检测

实验上已经有多种手段可以实现角分辨偏振拉曼光谱(ARPR)测试，但是不同配置往往会呈现出不同的结果。常用的ARPR实验配置是固定入射激光和散射信号的偏振方向，旋转样品。但是，随着低维材料的兴起，样品尺寸往往只有微米量级，而旋转样品会导致样品点移动，很难实现对微米级样品的原位角分辨拉曼光谱测试。所以重新系统地研究各种ARPR配置的优缺点并且找到对于微米级晶体材料优的实验方法显得十分必要。 中国科学院半导体研究所谭平恒研究组系统全面地分析了三种测量ARPR光谱的实验配置，给出了一般形式的拉曼张量在不同配置下拉曼强度的计算方法，并具体地以高定向热解石墨(HOPG)的基平面和边界面为例，研究了这些ARPR配置在二维材料拉曼光谱方面的应用。

拉曼光谱是探测单壁碳纳米管性质的重要手段。通过G模的峰型判定碳管的导电性（金属或半导体）和通过RBM模的拉曼频移计算碳管管径，是碳管拉曼光谱的两大主要应用。但是要通过分析拉曼光谱精确获得碳管的手性指数（n,m）仍然具有挑战，尤其是在仅有少波长激发的情况下。

CsPbBr3纳米片是以碳酸铯和溴化铅表面包裹上长碳链的有机配体形成前驱体，在溶剂热条件下(60−180 °C)合成的。另外，通过简单地改变铯油酸或溴化铅前驱体的加入量和加入顺序，可以实现CsPbBr3纳米片和Cs4PbBr6纳米晶之间的可逆化转变。研究中的发光测试，使用的是Fluorolog-3型荧光光谱仪。这套仪器的灵敏度、稳定性和分辨率都很高，为表征不同尺寸钙钛矿纳米片发光峰位红移提供了技术保障。

电脑提速100倍看似困难，却并非无法实现。德克萨斯理工大学电气与计算机工程学院的副教授何瑞博士（Rui He, Ph.D.）正在从事相关研究，她的新研究课题——新型二维材料“三碘化铬”，为提高电脑等电子设备的运行速度提供了希望。

基于OLEDs制备的显示屏柔韧性好可弯曲，且相较于LED屏幕更为轻薄、清晰、亮度高色彩鲜艳，且发光效率也更高。市面上常见的曲面电视就是OLED显示屏的绝佳应用案例。可以想见，将这种OLEDs制备的显示屏应用于手机屏制作，降低手机生产成本，或许会为折叠屏手机市场的拓展带来新契机。利用碳纳米点制备OLEDs虽然有种种优势，但其耐久性及对环境的敏感性一直是一个障碍。为克服这些技术难点，肯塔基大学化学系副教授金斗允博士选择先从基础研究做起，使用HORIBA FluoroMax荧光光谱仪的扩展版来研究碳纳米点。

Birch, et al., have shown that fluorescence anisotropy-decay in sols with two rotational correlation times can be explained by the existence of silica particles. This interpretation allows monitoring sol-gels in situ with sub-nanometer resolution. Because a fluorophore immobilized in a gel does not de- polarize fluorescence, one can study particle size well after the sol-to-gel transition time, a major advantage over scattering techniques (e.g., with neutrons or X-rays) where gel-scattering distorts the scattering function. Moreover, the rapid data-acquisition needed to acquire anisotropy-decay data within time-spans as short as a few minutes is aided greatly by the high-repetition rate of the NanoLED excitation sources from HORIBA Jobin Yvon.

The NanoLog® is an indispensable tool for studying fluorescence lifetimes of samples whose luminescence is primarily in the near-IR, such as quantum dots. Other uses for the NanoLog® include solid-state research, biosensing, and cancer studies. The NanoLog® also available with TCSPC multichannel-scaling options of 500 ns/channel and 2 ns/channel, as well as a broadband 5509 photomultiplier tube, sensitive from 300–1700 nm, with a timetransit spread of 1.5 ns.

With the use of this fiber-optic adaptor and the pinhole adaptor, many microscopic fluorescence measurements can be achieved. Most microscopes, including Nikon, Olympus, Zeiss, and Leica, are compatible with the Microscope Adapter.

This particular investigation of phosphor emission characteristics was made possible by the excellent stray-light reflection, sensitivity, and wide lifetime range of the FLUOROLOG-τ® producing rapid and accurate characterization of the phosphor.

Today’s state of art of technology requires more reliable, more efficient and powerful energy sources. Lithium-ion batteries are thus of high interest. Raman spectroscopy adapts to the different stages of life of these batteries, such as the characterisation of new materials for more flexible systems, failure analysis; but also more standard analysis of used material during charge/discharge process, including structural and electronic properties, and even robust, automated QC tests.

Spectroscopic ellipsometry is a powerful technique to characterize the thickness and optical constants of complex ferroelectric stacks with high accuracy and precision. Specific modelling features in this study include the characterization of the anisotropic sapphire substrate, rough overlayer and layer inhomogeneity with depth.

Liquid Crystal Modulation Spectroscopic Ellipsometry is an excellent technique for the highly accurate characterization of the compound semiconductor heterostructure AlGaN / GaN. Using the MM-16 spectroscopic ellipsometer it is a straightforward procedure to determine the film thickness and optical dispersions of the complete structure even where the film is several microns thick. The detailed knowledge of the optical parameters of AlGaN alloys is crucial for example for the design of opto-electronic devices. Furthermore, from the optical parameters a calibration curve could be constructed to provide a rapid and efficient determination of the Al content in the AlGaN layers. Thus Spectroscopic Ellipsometry also proves a non-destructive technique for AlGaN alloy composition determination. This method can be equally applied to other compound semiconductors such as SiGe, II-VI semiconductors or classical III-V semiconductors.

Optical characterization techniques proved to be complementary to optimize highmaterials used in microelectronic applications. This note shows that the VUV wavelength range of the UVISEL Phase Modulated Ellipsometer is particularly suitable for the accurate characterization of high-K film thickness and interfaces with nanoscale dimensions as well as optical properties and bandgap.

Spectroscopic ellipsometry is a powerful technique for high accuracy characterization of the thickness and optical constants of GeSbTe multilayer systems for rewritable optical disc applications. It was shown that measurement in the NIR range gives better accuracy for the analysis of these types of material. The use of the multiple sample analysis reduces parameter correlations and errors for the thinnest layers. Owing to the advanced modelling features included in the DeltaPsi2 software, it is a straightforward procedure to analyze such structures even with layers deposited on both sides of the substrate.

Spectroscopic ellipsometry is an excellent technique for the highly accurate characterization of TFT-LCD display panels based on a-Si and LTPS technologies. Owing to the sensitivity of the UVISEL spectroscopic ellipsometer and the advanced modeling features included in the DeltaPsi2 software it is possible to detect in a multistack different a-Si layers processed by various methods. Moreover the spectroscopic ellipsometry measurements allow determination of the grain size of p-Si films and illustrate the ability to characterize the crystallinity of silicon with high accuracy.

For multilayer structures it is always helpful and often necessary to know the properties of each film. Using the Jobin Yvon UVISEL NIR it is a straightforward procedure to investigate the thickness and optical properties of the complete PDP structure.

Phase Modulated Spectroscopic Ellipsometry is an excellent technique for the highly accurate characterization of complete TFT-LCD device. The technique allows the determination of film thickness, optical properties but also more complex properties such as graded or anisotropic layers and effect of dopants. In the flat panel industry the pressure to reduce manufacturing costs is and reliable metrology tools are required to control the different steps of the process. Spectroscopic ellipsometry is a non destructive technique which presents advanced capabilities and proven reliability tailored for qualification and on-line production control.

This example shows that PP-TOFMS is a fast and reliable technique for depth profiling of rare earth doped ZnO thin films. Tb and Eu prof les are obtained with high sensitivity and high depth resolution. This type of information is typically provided by SIMS, RBS or depth profiling XPS but not as rapidly and readily and at a higher cost. Such profiles turn out to be powerful complementary information to understand photoluminescence data.

稀土元素独特的电学、光学和磁性使其应用非常广泛，其中掺杂有稀土元素Eu和Tb的氧化锌薄膜可作为白光LED材料。等离子体飞行时间质谱仪（PP-TOFMS）可快速获得各元素随深度的分布，并获得镀层任意深度的全质谱，为快速全方位的表征此类材料提供了可能。

采用UVISEL相调制型椭圆偏振光谱仪对ZrO2 Thin Films on Glass Substrates样品进行分析,研究其膜层厚度和相应光学性质。

In electronics, silver alloys are used because of their conductive, mechanic and contact properties. These properties are improved by treatment of silver with different metallic oxides.This Application Note examines the analysis of Ag and metal oxides, with impurities such as Cd, Cu, Fe,Mg Ni, Sn and Zn.

采用UVISEL相调制型椭圆偏振光谱仪对ZrO2 Thin Films on Glass Substrates样品进行分析,研究其膜层厚度和相应光学性质。

LabRAM HR Evolution的超低波数附件使高通量单级光谱仪的低检测波数低至5cm-1，其操作非常方便。新一代的notch和带通滤光片确保仪器能够检测到其它普通光谱仪中难以获得的光谱范围，从而可以表征更多的样品特征信息。

1、能与多个激发波长匹配 2、内置数码相机设计，可实时观察样品 3、可提供物镜朝下或物镜侧向的两种配置选择，便于测量侧向发光器件或放置在正置低温恒温器中的样品

1、宽光谱覆盖范围 (200nm-1600nm) 2、内置数码相机设计，可实时观察样品 3、可提供物镜朝下或物镜侧向的两种配置选择，便于测量侧向发光器件或放置在正置低温恒温器中的样品