核心参数
产地类别: 进口
仪器种类: 斜插式
能量分辨率: 129eV@100,000cps
峰背比: 20,000:1
最大计数率: 1,000,000cps
元素检测范围: B-Cf
探测器面积: 有效晶体面积15m㎡或30m㎡
窗口类型: SATW
牛津仪器X射线能谱仪Xplore15/Xplore30的工作原理介绍
X射线能谱仪Xplore15/Xplore30的使用方法?
牛津仪器Xplore15/Xplore30多少钱一台?
X射线能谱仪Xplore15/Xplore30可以检测什么?
X射线能谱仪Xplore15/Xplore30使用的注意事项?
牛津仪器Xplore15/Xplore30的说明书有吗?
牛津仪器X射线能谱仪Xplore15/Xplore30的操作规程有吗?
牛津仪器X射线能谱仪Xplore15/Xplore30报价含票含运吗?
牛津仪器Xplore15/Xplore30有现货吗?
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Simultaneous EDS and EELS Analysis in the TEM
Introduction In Transmission Electron Microscopy (TEM) there are two ‘go to’ techniques for elemental analysis: Energy Dispersive X-ray Spectroscopy, (EDS), and Electron Energy Loss Spectroscopy, (EELS). EDS is a mature technique that can be used for most specimens. The intensity of generated X-rays is proportional to the mass thickness of the sample. However, this can become a limitation for very thin specimens or those comprising light elements. On the other hand, EELS is more suitable for thin samples where the thickness is less than the inelastic mean free path of electrons in the material. EELS does, however, give high signal to noise for light elements. Simultaneous acquisition of both signals is a powerful tool for materials analysis.
半导体
2020/06/15
牛津仪器科技(上海)有限公司
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