布鲁克 QUANTAX 微区荧光光谱仪

报价

¥100万 - 150万

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品牌

布鲁克

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型号

QUANTAX XTrace

荣誉奖项

产地

欧洲

布鲁克电子显微纳米分析仪器部

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产地类别： 进口

微区 XRF 是 SEM 中 EDS 分析的互补分析技术

扫描电子显微镜（SEM）的微区 X 射线荧光（Micro-XRF）技术是与传统能量分散光谱（EDS）能力补充的无损分析技术。这种分析技术对于未知样品中元素成分的表征非常重要，而未知样品的尺寸可以从厘米尺寸的不均匀样品到微米尺寸的颗粒
X射线激发源为微量元素的检测带来了更高的灵敏度（对于某些元素，检出限可低至 10ppm）。同时，光谱范围可以拓延（高达40 keV）以及探测深度可以更深
配备 X 射线管，结合微聚焦 X 射线光学器件，可产生 30 μm 的小束斑和高强度通量
模块化基于压电的样品台，专门设计用于安装在现有SEM 样品台上，使大面积高速元素X射线面分析"飞一样地"运行，速度高达4毫米/秒。这使得在 50 x 50 mm（或更大）的样本面积上采集 X 射线面分布数据成为可能。同时，轻元素光谱数据以及微量元素和/或更高能量的 X 射线数据也纳入快速且用户友好的工作流中
X射线激发的样品深度更深，这让多层系统的表征成为可能。1 nm 到高达40μm 的薄膜样品均可以分析，而这是用电子束源激发无法实现的

相关方案

综合地矿

陨石中元素含量检测方案(电镜部件)
Non-destructive sample analysis with high spatial resolution can be very difficult to accomplish using conventional EDS detectors as sample surface charging, electron beam damage and shading effects by topography are common problems in scanning electron microscopy. The BRUKER XFlash® FlatQUAD silicon drift detector (SDD) overcomes these limitations. The special geometry with an annular arrangement of detector elements offers a very high solid angle [1]. The XFlash® FlatQUAD detector allows the use of ultra-low beam currents and the investigation of samples with complex topography as demonstrated on two meteorite fall samples.
地矿 2021-09-02

陨石中元素含量检测方案(电镜部件)
Non-destructive sample analysis with high spatial resolution can be very difficult to accomplish using conventional EDS detectors as sample surface charging, electron beam damage and shading effects by topography are common problems in scanning electron microscopy. The BRUKER XFlash® FlatQUAD silicon drift detector (SDD) overcomes these limitations. The special geometry with an annular arrangement of detector elements offers a very high solid angle [1]. The XFlash® FlatQUAD detector allows the use of ultra-low beam currents and the investigation of samples with complex topography as demonstrated on two meteorite fall samples.
地矿 2021-09-02