电镜荧光屏配件

电镜荧光屏配件与光导联合使用用于电镜的探测和成像，电镜荧光片采用Crytur公司一流的闪烁单晶，具有荧光转换效率高，寿命长的特点，是SEM扫描电镜和TEM透射电镜的理想探测与成像单元。

Production range of microscopy detection units covers detectors for scanning (SEM) and transmission (TEM) electron microscopy.

SEM DETECTORS
SE (secondary electron) detection	Flat scintillator (standard) Conical Geometry (higher light output) On optical fiber (miniaturized)
BSE (back-scattered electrons) detection	Annular (standard) Segmented In-lens (small aperture down to 0.3 mm)
CL (cathodoluminescence)	universal quartz lightguide working at any working distance parabolic
TEM DETECTORS
STEM detectors	ADF HADF BF
TEM detectors	Imaging systems based on thin single crystal screens on FOP Photon-counting detectors

Crytur cooperates closely with customers on the design and development and can also deliver special detector designs according to the custommers needs。

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