This presentation delves into the intricate world of van der Waals (vdW) heterostructures, explicitly focusing on trapped bubbles' optical and electronic properties in twisted bilayer graphene (TBG). Utilizing a synergistic combination of Imaging Spectroscopic Ellipsometry (ISE) and Atomic Force Microscopy (AFM), this study non-destructively examines the complex surface system of TBG on hexagonal boron nitride (hBN). The ISE method determines layer thickness and optical properties, while AFM reveals the Moiré superlattice formed by the lattice mismatch of layers. The research highlights the fabrication of the TBG on hBN heterostructure using a dry transfer technique, followed by characterization through ISE and AFM. Notably, trapped bubbles at the hBN/SiO2 interface, resulting from the sample preparation process, act as local optical cavities and strain-induced local emitters, offering potential applications in optoelectronics and photonics. ISE measurements provide insights into the effect of bubble formation on the optical properties of the vdW heterostructure, revealing a decrease in refractive index and an increase in extinction coefficient in the presence of the bubble. Concurrently, AFM measurements corroborate the ISE findings and offer additional details on the sample's morphology and electrical characteristics, including the visualization of the Moiré superlattice and current distribution across the TBG layer. The combined use of ISE and AFM enhances the understanding of the trapped hydrocarbon (HC) bubble's influence on the heterostructure's properties. The study's findings contribute to developing new characterization tools for the exploding field of optoelectronics and photonics, paving the way for future correlative microscopic explorations.查看更多