美国Rtec双模式三维形貌仪(白光干涉+原子力显微镜)
美国Rtec双模式三维形貌仪(白光干涉+原子力显微镜)
美国Rtec双模式三维形貌仪(白光干涉+原子力显微镜)
美国Rtec双模式三维形貌仪(白光干涉+原子力显微镜)
美国Rtec双模式三维形貌仪(白光干涉+原子力显微镜)
美国Rtec双模式三维形貌仪(白光干涉+原子力显微镜)

¥50万 - 100万

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Rtec

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WLI1000

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美洲

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产品种类: 非接触式轮廓仪/粗糙度仪

Rtec-instruments new multi-functional profilometers are designed to give best performance with leading edge optics, advanced algorithms and engineering designs. Each of our profilometer has high end electronics, negligible drift, low floor noise and is extremely easy to use.

We offer several profilometer models that are suited for various applications. Nano to macro range can be scanned with ease using offered profilometer. Each profilometer can create high resolution 3d images, measure flatness, roughness, waviness, step height, defects, scratch , volume wear, features etc. The profilometer comes with our proprietary imaging software and/or can be used with several standard software such as SPIP or Mountain Surf.

Few of our standard profilometer models are mentioned below. Please contact us to learn more about our profilometer.

Main Features: The combo unit allows to mount both AFM and white light interferometer on same platform. The large XY stage 210x200mm allows to scan small to large samples with easy. Same area of sample moves automatically between AFM and profilometer. Both AFM and profilometer has independent Z stage.
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White light interferometer module
  • Multi color high intensity LED
  • 5 million pixel 3D image
  • High quality objectives
  • Low noise
  • PSI and VLI modes
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The unique algorithm and latest generation hardware allows the tester to exploit the advantages of multi color led. Combination of blue and white LED gives the best XYZ resolution images and green color gives least florescence . Multi-color LED also allows to generate real color images of sample. Advanced camera, high speed controllers, fast data acquisition allows the tester to create images upto 5 million pixels. Tester has both Coarse (WLI) and fine mode (PSI) that allows it to achieve 0.01nm resolution in roughness measurement. We use high quality objectives from Nikon. Tester comes with 6 objective turret that can accommodate objectives from 2.5x to 100x..
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AFM module
  • Integrated high resolution video microscope
  • Linearized xy piezoelectric scanner
  • Accommodates standard-sized AFM probes
  • Includes vibrating and non-vibrating modes plus lateral force and phase mode imaging
  • Utilizes a direct drive motorized probe approach
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Using the industry standard light lever force sensor, all of the standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes. Control software, is simple and intuitive to use..

Specifications:  WLI
Scanning range
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Up to 150mm x 150mm (Optional 200m, 310mm)
Sample thickness 100mm
Tilt +/- 10degree
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Objective Magnification 50x 20x 10x 5x 2.5x
Numerical Aperture 0.55 0.40 0.30 0.13 0.075
Field of View (µm) 266 x 266 532 x 532 1064 x 1064 2128 x 2128 4256 x 4256
Spatial Sampling with 0.14 0.28 0.55 1.1 2.2
Optical resolution @ 0.50 0.69 0.92 2.12 3.67
Working distance (mm) 3.4 4.7 7.4 9.3 10.3
Depth of focus @550nm 1.16 2.19 3.89 20.72 62.25
Degrees of maximum 22.6 9.5 4.8 2.4 1.2
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  • AFM Contact AFM in air/(liquid optional)
  • Semicontact AFM in air/(liquid optional)
  • True Non-contact AFM
  • Phase Imaging
  • Lateral Force Microscopy (LFM)
  • Force Modulation
  • Magnetic Force Microscopy (MFM) etc.
  • Scanning range 100um x 100um x 15um (+/-10%)
  • Digital closed loop control for X, Y, Z axes
  • Active elimination of XY phase lag, overshooting and ringing results in fast scanning without any dynamic image distortion
   
Industries
   
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Automotive, cosmetic, aerospace, chemical, polymer, coatings, paint, semiconductor etc.
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    美国Rtec三维形貌仪测量系统沿着纵轴捕获一系列位置的光强数据。通过白光干涉图的形状,干涉图的局部相位或者是二者的结合来确定表面位置。本公司还有激光共焦,白光共焦,拉曼光谱仪等,可以把这些设备自由组合在一起,以实现客户的不同需求
    特点:
    快速直观的操作
    较高的计算程序,精确的高测量速度和简便的操作软件,使用户能够快速的分析和创建报告
    多个物镜
    带有6物镜转轮,包括多个物镜:长焦,短焦,不同数值孔径,投射镜头等
    电子器件
    先进的控制器,低机械噪声,自校准系统,可选波长,64位并行处理器,标准分辨率达到1920*1920
    硬件
    能够被固定到全自动化的平台,高强度LED10年保修,高级精加工零部件,低能耗,远程访问,内置相机侧视图,有效照明等。
    软件
    三维虚拟软件
    影像分析
    多种标准,粗糙,平面,波浪以及其他表面参数
    微粒(粒子)和细孔分析
    力曲线分析
    附带傅里叶分析
    过滤
    用户界面报告的创建和编辑
    影像编辑特征-光,颜色等
    尺寸,表面积,体积,承载比分析
    纹理计算,分类,其他纹理分析
    光谱和分形分析
    先进的统计分析
    能够输出原始数据,影像,全部报告
    数个可用的附加功能
    参数:
    内校准
    4百万像素
    可选波长
    高强度长寿命LED
    1920*1920成像
    64位中央处理器
    低机械噪声
    并行处理
    6物镜转轮

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美国Rtec双模式三维形貌仪(白光干涉+原子力显微镜)信息由德可纳利(上海)仪器有限公司-KD Scientific中国代理为您提供,如您想了解更多关于美国Rtec双模式三维形貌仪(白光干涉+原子力显微镜)报价、型号、参数等信息,欢迎来电或留言咨询。
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