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文献名： Structural, morphological and optical properties of Bi NPs obtained by laser ablation and their selective detection of L-cysteine 作者： Ramon Gabriel Teixeira Rosaa, Celso de Araujo Duartea , Wido Herwig Schreinera, Ney Pereira Mattoso Filhoa, Arandi Ginane Bezerra Jr.b, Andersson Barisonc, Fernanda Maria Marins Ocamposc a Departamento de Física, Universidade Federal do Paraná Centro Politécnico, CP 19044, 81531-990 Curitiba (PR), Brazil b Departamento Acadêmico de Física, Universidade Tecnológica Federal do Paraná, 80230-901 Curitiba (PR), Brazil c Departamento de Química, Universidade Federal do Paraná Centro Politécnico, CP 19081, 81531-990 Curitiba (PR), Brazil 摘要：In the present work we show the results of the investigation of the properties of bismuth nanoparticles (NPs) obtained by the laser ablation in water. The samples were characterized by various techniques: UV/vis spectroscopy, dynamic light scattering, transmission electron microscopy, X-ray photoelectron spectroscopy, X-ray diffraction, nuclear magnetic resonance and zeta potential. The NPs were metallic and surface oxidated, exhibiting absorption peak at 257 nm due to the surface plasmon resonance. The interaction between the NPs and various amino acids was studied and revealed a selective sensibility to cysteine on a range of concentration from 80 to 720 μM, which we attribute to a dimerization of cysteine to cystine probably complexed to the nanoparticle surface by electrostatic interactions, leading to the modification of the NP absorption spectrum. 关键词：Bismuth; Nanoparticles; Laser ablation; Cysteine

金属检测技术的局限性之一是对于像电线和大头针这样相对比较小的、长条形金属异物就很难检测出来。这些类型的污染物通常表现出“方向效应”，即金属探测器所检测到的信号很大程度上取决于污染物与探测孔的方向关系。方向效应给金属检测系统带来了挑战——这一挑战乍一看并不是那么严重，但事实上它可能会给消费者的安全以及品牌声誉带来严重的影响和危害。

三维X射线显微镜是当前获取样品内部三维结构最有力的工具之一，而且作为无损的非破坏成像技术，它适用于各种形态的样品，无需包埋，镀层或切片等复杂的样品前处理。布鲁克skyscan系列三维X射线纤维成像系统，包含稳定易用的高分辨率成像设备，功能强大的软件套装，可为不同领域的应用提供完善的解决方案。 我们为大家带来桌面型三维X射线显微镜在药物与医疗器械领域的应用介绍。

当称量仪器用于与质量控制相关的测量时，校准是必须定期执行的关键操作之一。国际上有许多标准规范都有这方面的要求，例如ISO9001、GMP法规以及与食品安全相关的一些标准。然而关于校准的定义、实施和校准的具体操作在全球范围内并没有一个完全统一的标准。在此，我们首先需要了解一下什么是校准，以及与调整和检定的区别。