详细参数
扫描范围X-Y Zscan range: 90μm x 90μm x 10um typical,
噪音指标Vertical noise floor: <50pm RMS
样品Sample size/holder: 150mm vacuum chuck, 15mm thick; up to 40mm thick with optional frame spacer
样品台移动范围Motorized positioning stage (X-Y axis) 150mm x 150mm inspectable area; Programmable for multi-site measurements
光学显微镜Microscope optics 5-megapixel digital camera; 180μm to 1465μm viewing area; digital zoom and motorized focus
标准工作模式AFM MODES
Standard Contact Mode, Lateral Force Microscopy, TappingMode™, PhaseImaging™, LiftMode, Magnetic Force Microscopy, Electric Force Microscopy, Dark Lift, Force Spectroscopy, Nanoindentation, Nanolithography
划重点
我司(上海朔仪检测科技有限公司)常年提供进口显微镜及相关耗材备件
我司可约线下测样,提供一年质保,送探针。