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美国Hummingbird是电镜业内最知名的原位透射应用厂家至今已有10年的原位透射研发经验，蜂鸟来源于著名的柏克林国家实验室，其专利的技术如液体样品杆，气氛反应样品杆，加热样品杆得到电镜工作者广泛的认可。
Board Contact (Type I)
This contact configuration has a conveniently removable reusable sample carrier onto which the chip is mounted.
Direct Chip Contact (Type II)
This contact configuration has a unique single chip that is directly inserted in the holder in a proprietary connector with up to 9 electrical contacts.
Spring Contact (Type III)
The spring contact configuration is a variation of the Type I connector that has fixed location spring contacts between the chip and the carrier.
Application Examples
?Correlating electrical properties of nanoscale material with microstructure ?Relating material defect populations to the electrical response Electromigration studies ?Operating microelectomechanical systems (MEMS)-based mechanical testing devices ?In-situ testing of solid-state energy devices
Options
?The 1600 Series Holder can be customized from a range of options. ?Custom designed sample carriers to fit any TEM sample geometry. ?Standard Bundled Shielded Wiring Option ?Low noise, individually shielded cabling option for pA range current measurements. ?Keithley 2400 SMU
Accessories
?Accessories available to maximize the versatility and ease of use of your Electrical Biasing Holder. ?Specialized Sample Substrate Chips ?Vacuum Tip Cover ?Custom Chip Carriers ?Keithley 2400 SMU
Nanoelectronics
Allowing researchers to perform in-situ TEM electrical measurements is a powerful tool for research into next generation of nano-scale electrical devices. Electrical signals can be applied or measured on individual nano-structures and devices, revealing relations between electrical behavior and microstructure.
Top: TEM images taken in-situ during the
voltage scan in panel, at times I, II, III, and IV. Note the correlation of
resistance with void size.
Bottom: Voltage scan on a single nanowires device (inset). The blue square in the inset shows the location of the TEM observation in panel B.
From Void Formation Induced Electrical Switching in Phase-Change Nanowires, Nano Letters 8, 4562, 2008. Image courtesy of Profs. Yi Cui, Stanford University and Andrew Minor, UC Berkeley.
Specification:
Items | 1600 Series |
Tilt Range | ±45° depending on microscope and pole piece |
Number of Electrical Contacts | 6, 8, or 9 * |
Contact Type | Flexible wirebond contacts or fixed spring contact |
Chip Carrier | Mobile Chip Carrier |
Carrier Compatibility | Standard TEM Sample Supports |
Carrier Size | Fits up to 3 x 6 mm samples |
Wiring | Standard or Low-noise shielded |
TEM Compatibility | FEI, JEOL, Hitachi, Zeiss |
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企业名称
上海硕赛国际贸易有限公司
企业信息已认证
企业类型
有限责任公司(自然人投资或控股)
信用代码
913101153207402866
成立日期
2014-10-16
注册资本
人民币200.0000万元整
经营范围
从事货物及技术的进出口业务,机械设备、仪器仪表、计算机、软硬件及辅助设备(除计算机信息系统安全专用产品).通讯器材及配件、机电设备、化工原料及产品(除危险化学品,监控化学品、烟花爆竹、民用爆炸物品、易制毒化学品)、电子产品、日用百货的销售,商务信息咨询(除经纪).(依法须经批准的项目,经相关部门批准后方可开展经营活动)
溢鑫科创
公司地址
上海市沪青平公路2008号（紧靠明珠路）竞衡大业广场803室
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