电学特性
FEOL Electrical Characterization
In IC device manufacturing electrical characteristics of layers and films must be well controlled. Conventional contact test methods on monitor wafers, like the 4-point probe FSM offers, do no longer meet modern requirements. State of the art IC feature extremely thin, often only a few atomic layers of material. FSM's contactless RsL probe for sheet resistance and leakage as well as the non-destructive EOT probe for IC-CV measurements meet the challenge to characterize ultra shallow junctions and thin dielectric materials on production wafers.
FSM offers contact and non-contact electrical characterization metrology used in FEOL device making.
3DIC TSV and BWS TTV硅片表面形貌测量
Film Stress薄膜应力量测仪
FEOL Electrical Characterization 电学特性
Thin wafer metrology 晶圆测量学
Film Adhesion漆膜附着力测试
FSM offers contact and non-contact electrical characterization metrology used in FEOL device making.
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企业名称
铂悦仪器(上海)有限公司
企业信息已认证
企业类型
有限责任公司(自然人独资)
信用代码
91310117698818989B
成立日期
2009-12-29
注册资本
人民币500.0000万元整
经营范围
仪器仪表、实验室设备、机械设备及配件、机电设备及配件、电子产品、化工原料及产品(除危险化学品、监控化学品、烟花爆竹、民用爆炸物品、易制毒化学品)、一般劳防用品、玻璃制品的销售;仪器仪表、实验室设备、机械设备及配件、机电设备及配件、电子产品的技术开发、技术咨询、技术转让、技术服务;一类医疗器械、仪器仪表的维修;自有设备租赁(除金融租赁);广告设计、制作、利用自有媒体发布各类广告、电子商务(不得从事增值电信、金融业务);从事货物及技术的进出口业务。(依法须经批准的项目,经相关部门批准后方可开展经营活动)
铂悦仪器(上海)有限公司
公司地址
上海市松江区莘砖公路518弄漕河泾开发区松江高科技园区28号楼3A
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