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当前位置: Bruker Nano Surfaces > 解决方案 > 台阶仪及AFM在3D MEMS量测中的应用

台阶仪及AFM在3D MEMS量测中的应用

2008/07/21 10:03

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2008/07/21
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Stylus profilers are often used to cost effectively measure step heights, bow, planarity, and roughness on the surface of MEMS. The AFP, exclusively available from Veeco, combines the long scan capability of the stylus profiler with the imaging resolution of the AFM, enabling measurement combinations on MEMS that were previously impossible to make with any single metrology tool. Stylus profiling and AFP provide the longest continuous scans of a surface, up to 200mm and 100mm, respectively. Veeco’s Dektak Series stylus profilers and Series Vx AFP benefit from ongoing technology transfer between the various metrology product lines of Veeco. The Dektak Series stylus profilers use the same data analysis software as Veeco’s NT Series Optical Profilers, streamlining the comparison of measurements made on MEMS with these two very different technologies. The AFP uses not only the Veeco NanoScope AFM image analysis software to make measurements on 3-D images it captures, but also core AFM hardware to scan and capture profiles and images of MEMS wafers and devices with unparalleled resolution.

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相关方案

台阶仪在三维形貌表征领域的应用

Stylus-based surface profiling is a standard technique for accurate, repeatable surface shape, topography and step height measurement in applications ranging from semiconductor R&D to solar cell QC.

2008/12/15

3D surface Profi ling applications

Stylus-based surface profiling is a standard technique for accurate, repeatable surface shape, topography and step height measurement in applications ranging from semiconductor R&D to solar cell QC. In recent years, the ability to map surfaces in 3D has greatly increased the capability of stylus profilers; yet despite such recent advancements, it is not uncommon in cutting-edge fabs, solar cell companies, industrial manufacturing facilities, colleges, universities and various research institutes to see R&D, QC and process monitoring operations performed still using technologies developed over sixty years ago.

2008/10/17

Dektak Stylus Capabilities How to Choose the Correct Stylus for Any Application

Dektak® stylus profilers provide accurate, high resolution measurement of surface shape and texture. The heart of a Dektak system is its measurement stylus, which runs over the surface as the sample is moved beneath it on the stage. A variety of stylus shapes and sizes are available to optimize measurement for particular applications. This paper describes the variety of styli that are currently available from Veeco, and guidelines for choosing the optimal tips for your application.

2008/07/21

Surface Texture Analysis Using Dektak Stylus Profilers

Understanding surface texture requires both accurate assessment of the surface profile and the proper analytical functions to characterize the surface. Dektak stylus profilers provide both, with low-force, high precision scanning and a comprehensive set of analytical functions and filters to make the most of scan data. For more on surface texture analysis, please review the excellent sources shown below.

2008/07/21

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