日本电子最先端透射电子显微术研讨会第一轮通知

日本电子最先端透射电子显微术研讨会
JEOL High-End Transmission Electron Microscopy Seminar
2008年6月17日（星期二）北京


We JEOL are pleased to announce for holding JEOL High-End Transmission Electron Microscopy Seminar on June 17th in Beijing.
We invited world-class researchers as shown below for delivering their talks on recently prominent accomplishment using the latest transmission electron microscopes. We are also going to introduce the latest “aberration corrected” TEM and STEM and its abundant application data in imaging and analysis. TEM sampling technologies such as a multi-beam system and the ion slicer is also one of remarkable topics to be presented by JEOL.


Venue:  Shangri-La Hotel（Beijing）1F Grand Ballroom.  29 Zizhuyuan Road, Beijing100089.
         北京香格里拉饭店1层景阁大宴会厅1号、2号场地。北京紫竹院路29号。 电话：010-68412211
Time: 9:00AM – 5:10PM (including lunch)


Entry: Free but need registration at the first-come-first-serve basis


Invited talks:


Prof. Kazuo Furuya (古屋一夫)
High Voltage Electron Microscopy Station（超高压电镜共用中心）
National Institute for Materials Science（独立行政法人　物质‧材料研究机构）,Tsukuba, Japan
Talk: Nanofabrication with intense and focused electron beam and ultra-high vacuum Cs corrected STEM


Prof. Yuichi Ikuhara（幾原雄一）
Institute of Engineering Innovation（大学院工学系研究科综合研究机构）
School of Engineering（工学部）
The University of Tokyo（东京大学）,Tokyo, Japan
Talk: STEM Characterization of Ceramic Grain Boundaries


Prof. Chen Fu-Rong（陈福荣）
Department of Engineering and System Science（工程与系统统计科学系）
National Tsing Hua University（国立清华大学、台湾）, Taipei, Taiwan
Talk: Development of Wet Cell/Phase Plate TEM for Advanced Biological Imaging


Reservation: Call 010-68046321, Ms. 孙莉(Sun Li).  E-mail: sun.li@jeol.com.cn