nano-TA原位纳米热分析系统

仪器简介：
nano-TA原位纳米热分析系统可以提供小于100纳米范围的原位热力学测量与分析，
使用独有的高分辨率热扫描探针可以让用户获得样品测试区域内30nm超高
分辨率。

nano-TA是当今Polymer和Pharmaceutical等方向研究人员亚微米原位热力学
分析唯一利器。

技术参数：
Temp. Ramp Rate: up to 1500 ℃/min
Max. Temp. of Probe: 500℃(dependent on probe)
Imaging Modes: Contact mode/Oscillationg mode(dependent on SPM)
Probe Spring Constant: ranges from 0.1N/m to 5N/m
Probe Resonant Frequency: ranges form 20 to 50kHz
Tip Radius: 10-20nm
Tip Height: 1-5micros

主要特点：
*System incldues Software, Power Supply , TMA controller, CAL box, Bridge box, Calibration samples and five nano-TA silicon probes
*Probes come premounted for easy exchange and allow high resolution imageing and heating up 500℃
*Rapid controllable Thermo-Mechanical Analysis with heating rages of up to 1500 ℃/min.
*Indentify/Characterize individual phases from their onset and peak temperatures and by mesuring their thermal properties
*Currently compatible with a number of commercially availabe SPMs contact Anasys Insturments to see if your system will operate with nano-TA