Characterising Complex Rock Samples using Symmetry
IntroductionGeological samples can be extremely challenging to analyse using EBSD, not only are they non-conductive, but manyrocks contain a large number of phases, typically with low symmetry and often producing relatively weak diffractionpatterns. The challenge is twofold: firstly the EBSD detector needs to be sensitive enough to acquire good, highresolution EBSPs in a short time period, and secondly the software needs to be able to distinguish reliably between all theminerals present in the sample.In this application we demonstrate the power of the Symmetry® CMOS-based detector coupled with the AZtec® softwarefor the successful analysis of a multiphase, deformed eclogite sample. The extreme sensitivity of Symmetry enables highquality diffraction patterns to be collected in just a few milliseconds, and the advanced indexing algorithms within AZtec,as well as the full integration of EDS data, ensure reliable and accurate measurement of all phases.