SpotOn位敏探测系统
SpotOn位敏探测系统 筱晓光子供应SpotOn位敏探测系统,光谱范围350-1100nm 、位置精度±0.1um或者光束尺寸±0.025%。该系列位敏探测系统用于测量:激光中心/位移/功率的测量、光学系统准直及品质控制、旋转及位移的测量、平面度及准直性的校准、振动及缺陷的监控。ModelDescriptionsSPOTUSB-LLateral effect PnP 9mm×9mm, no glass coverSPOTUSB-NLateral effect PnP 10mm×10mm, with glass coverSPOTUSB-QFour quadrant PnP 10mm×10mm, with 30um gap, no glass coverSPOTUSB-UFour quadrant PnP 10mm×10mm, with 10um gap, with glass coverSPOTON-LALarge aperture, 135mm×100mm, 400-800nmOptional headsL44Lateral effect PnP, usable beam size25mmL18Lateral effect PnP 18mm×18mm, with glass coverL4Lateral effect PnP 4mm×4mm, no glass coverOptional accessoriesNG4ND filter in housing (3/4"-32 thread)NG9ND filter in housing (3/4"-32 thread)NG10ND filter in housing (3/4"-32 thread)Hood55mm long, for ambient light suppression