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IPFA2013培训讲座演讲者及培训摘要教程安排Date / TimeMorning (9:00am - 12:00noon)Afternoon (2:00pm - 5:00pm)15 July 2013(Monday)讲座1:失效分析:最佳实践、挑战和趋势Dr. Phillippe Perdu, CNES, France讲座2:在高介电常数介质/金属堆栈中的介电击穿:用纳米技术研究击穿所诱导的形态变化和缺陷Prof. Kin-Leong Pey, SUTD, Singapore16 July 2013 (Tuesday)讲座3:MOS器件的辐射响应和长期可靠性Prof. Daniel M. Fleetwood, IEEE fellow, Vanderbilt University, USA讲座4:先进器件的可靠性:从确定性的失效机理到时间有关的变化无常Prof. Guido Groeseneken, IMEC, Belgium讲座1:15thJuly MorningBy Dr. Phillippe Perdu, CNES, FrancePhilippe Perdu is the Senior Expert in microelectronics at CNES. He has led the VLSI Failure Analysis CNES laboratory since 1988. His main activity is to develop techniques and to adapt tools for analysis of electronic components dedicated to space applications. The main target is fault isolation / defect localization. 主题:失效分析:最佳实践[size
在广东什么时候有光谱的培训或讲座啊?有的话,大家留个消息!谢谢了![em09511]
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