飞行时间二次离子质谱仪（TOF-SIMS）一直被广泛应用在科研和工业领域中，例如在半导体的杂质分析、高技术的微观尺度材料分析以及聚合物和有机材料的剖析中。 TOF-SIMS在表面分析中虽然有着极高的表面灵敏度和亚微米級的空间分辨率等优势，但当每次检测一些添加剂和聚合物组成的混合物时都会面临如何正确解析数据和判定成分的实际困难。为了解决这个问题，ULVAC-PHI公司开发了配备有非破坏性串联质谱（MS/MS）的TOF-SIMS仪器，并将其应用到各种有机材料和生物应用当中。MS / MS的出现不仅使质谱分析变得更容易，而且在对分析结果的判定方面有了实质性的飞跃，不再是对分析结果的猜测，而是获得明确清晰的答案。在本次报告中，我们将详细介绍该仪器和新技术的基础原理及应用，让大家更全面、细致的了解该仪器如何在现今的科研工作中帮忙解決各种实际的问题。

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is widely used in industrial fields such as impurity analysis of semiconductors, analysis of high technology micro scale materials, and mass spectrometry of polymer and organic materials. Despite dramatic improvements in surface sensitivity and the resulting measureable spatial resolution, the unique identification of each detected mass peak within the mixture of additives and polymer compositions on the surface of real polymer samples has remained problematic. In order to solve this problem, we have developed the TOF-SIMS instrument equipped with tandem MS (MS/MS), and applied it to the various kinds of organic materials. From simplified MS/MS spectrum, the spectrum interpretation is much easier than before. In this tutorial, we will introduce our unique instrument, and demonstrate its capabilities.