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Non-Contact High Sensitivity Vibration Sensor Model VS-5020 Optodyne's VS-5020 Vibration Sensor is a noncontact,highly sensitive means of measuring displacement,velocity,and acceleration. Performing as a storage oscilloscope for mechanical vibration, the VS-5020 meets precision engineering requirements of microelectronic,aerospace,automotive,and R&D applications.A two-axis system,the VS-5020 provides measurement accuracy of 1 ppm, resolution to 0.1 microinch, speed up to 200 in/sec, and frequency response from do to 400 kHz. The extremely high signal-to-noise ratio of this two-axis system permits the user to measure simultaneously both target and background phenomena, while maintaining the integrity of each measurement.
Non-Contact High Sensitivity Vibration Sensor Model VS-5020 Optodyne's VS-5020 Vibration Sensor is a noncontact,highly sensitive means of measuring displacement,velocity,and acceleration. Performing as a storage oscilloscope for mechanical vibration, the VS-5020 meets precision engineering requirements of microelectronic,aerospace,automotive,and R&D applications.A two-axis system,the VS-5020 provides measurement accuracy of 1 ppm, resolution to 0.1 microinch, speed up to 200 in/sec, and frequency response from do to 400 kHz. The extremely high signal-to-noise ratio of this two-axis system permits the user to measure simultaneously both target and background phenomena, while maintaining the integrity of each measurement.
Non-Contact High Sensitivity Vibration Sensor Model VS-5020 Optodyne's VS-5020 Vibration Sensor is a noncontact,highly sensitive means of measuring displacement,velocity,and acceleration. Performing as a storage oscilloscope for mechanical vibration, the VS-5020 meets precision engineering requirements of microelectronic,aerospace,automotive,and R&D applications.A two-axis system,the VS-5020 provides measurement accuracy of 1 ppm, resolution to 0.1 microinch, speed up to 200 in/sec, and frequency response from do to 400 kHz. The extremely high signal-to-noise ratio of this two-axis system permits the user to measure simultaneously both target and background phenomena, while maintaining the integrity of each measurement.
