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The UpIR is designed as a tall structured accessory with the sampling surface above the plane of the spectrometer and is used by placing large, solid samples face down onto the top plate of the accessory. In the case of powdered or small solids, they can be placed into a suitable sampling cup at the top of the UpIR. This design is uniquely suitable for mid-IR analysis of coatings on metallic surfaces of large or small samples. For this application, analysis is rapid and easy because no sample preparation or cleanup is required.
Out-of-compartment design for analysis of large samples
Upward looking optics providing easy analysis of samples placed face down
Pre-aligned, fixed position optical components for reproducible, high quality data
The information in this publication is provided for reference only. All information contained in this publication is believed to be correct and complete. PIKE Technologies, Inc. shall not be liable for errors contained herein nor for incidental or consequential damages in connection with the furnishing, performance, or use of this material. All product specifications, as well as the information contained in this publication, are subject to change without notice. This publication may contain or reference information and products protected by copyrights or patents and does not convey any license under the patent rights of PIKE Technologies, Inc. nor the rights of others. PIKE Technologies, Inc. does not assume any liability arising out of any infringements of patents or other rights of third parties.
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