找不到产品？留下需求帮您找
一键询价
-
激光干涉仪型号： XL80 -
Hitachi日立CT15RE台式离心机型号： CT15RE -
Hitachi日立超速离心机CP70ME型号： CP70ME -
电热鼓风干燥箱型号： CS101-ABN -
Agilent 8890 气相色谱系统型号： 8890 GC -
全自动桌面溶出度测试系统RTJ3000+DS-3000型号： RT-J3000+DS3000 -
全自动溶出度测试仪RT-3型号： RT-3 -
流通池法溶出度测试仪DF-7型号： DF-7 -
自动桌面溶出度测试系统RT-J2000+DS2000α/DS3000型号： RT-J2000+DS2000α/DS3000 -
日立Primaide PLUS高效液相色谱仪型号： Primaide PLUS
获取电话
Period: 70nm pitch nominal, one dimensional array. Accuracy is +/- 0.25nm. Calibration certificate will give the actual pitch of the standard.
Surface structure: Silicon Dioxide ridges on Silicon, 4x3mm dimensions. Ridge height and width are both about 35nm (not calibrated).
Usability: The calibrated pattern covers a 1.2 x 0.5mm area. There is sufficient usable area to make thousands of measurements without reusing any areas contaminated or altered by previous scans.
AFM: Use in contact, tapping and other modes with image sizes from 100nm to 3um. Mounted on a 12mm steel AFM disk.
SEM, Auger, FIB: Can be used for a wide range of accelerating voltage (1kV-20kV) and calibrates images from 25kX to 1000kX. Can be supplied unmounted or mounted on an SEM stub of your choice.
Certification: There is a version with a non-traceable manufacturer’s certificate stating average pitch, based on batch measurements.
There is also the traceable, certified version measured in comparison with a standard calibrated at PTB (Physiklisch-Technischen Bundesanstalt in Braunschweig, Germany, is the German counterpart of NIST). The standard is NIST traceable by virtue of the mutual recognition agreement by NIST and