核心参数
仪器种类: 原子力显微镜
产地类别: 进口
仪器类型: 材料型
定位检测噪声: XY≤0.3nm, Z≤15pm
样品尺寸: 直径≤20mm, 高度≤10mm
样品台移动范围: 5mm*5mm
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AFAM样品横向刚性测试结果
1. AFAM is a state-of-the-art SPM technique that can be used to map variations in surface hardness of soft as well as very hard samples where other techniques, such as Phase Imaging or Force Modulation, fail. 2. In AFAM mode, the resonance response from the cantilever is measured when the cantilever tip is in contact with the sample surface. By adjusting the force of contact the influence of adhesion force can be almost excluded or approached to zero. 3. With AFAM it’s possible to perform numerical calculations of hardness and Young’s module, as this unique opportunity is included in our software as an option based on the theory of Prof. Walter Arnold. 4. The contrast of AFAM images is much sharper comparing with one obtained in Phase Imaging or Force Modulation mode. 5. AFAM can be operated in air as well as in liquid environment (i.e. in droplet). 6. AFAM is a non-destructive technique.
其他
2014/02/28
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恩特-梦迪特服务和物流有限公司(俄罗斯NT-MDT公司上海代表处)
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