紫外可见分光光度法鉴别掺兑潲水油的花生油

Stylus-based surface profiling is a standard technique for accurate, repeatable surface shape, topography and step height measurement in applications ranging from semiconductor R&D to solar cell QC.

文献名： Structural, morphological and optical properties of Bi NPs obtained by laser ablation and their selective detection of L-cysteine 作者： Ramon Gabriel Teixeira Rosaa, Celso de Araujo Duartea , Wido Herwig Schreinera, Ney Pereira Mattoso Filhoa, Arandi Ginane Bezerra Jr.b, Andersson Barisonc, Fernanda Maria Marins Ocamposc a Departamento de Física, Universidade Federal do Paraná Centro Politécnico, CP 19044, 81531-990 Curitiba (PR), Brazil b Departamento Acadêmico de Física, Universidade Tecnológica Federal do Paraná, 80230-901 Curitiba (PR), Brazil c Departamento de Química, Universidade Federal do Paraná Centro Politécnico, CP 19081, 81531-990 Curitiba (PR), Brazil 摘要：In the present work we show the results of the investigation of the properties of bismuth nanoparticles (NPs) obtained by the laser ablation in water. The samples were characterized by various techniques: UV/vis spectroscopy, dynamic light scattering, transmission electron microscopy, X-ray photoelectron spectroscopy, X-ray diffraction, nuclear magnetic resonance and zeta potential. The NPs were metallic and surface oxidated, exhibiting absorption peak at 257 nm due to the surface plasmon resonance. The interaction between the NPs and various amino acids was studied and revealed a selective sensibility to cysteine on a range of concentration from 80 to 720 μM, which we attribute to a dimerization of cysteine to cystine probably complexed to the nanoparticle surface by electrostatic interactions, leading to the modification of the NP absorption spectrum. 关键词：Bismuth; Nanoparticles; Laser ablation; Cysteine

2022年3月15日，国家市场监督管理总局（国家标准化管理委员会）批准了新版《生活饮用水卫生标准》（GB5749-2022），该标准将于2023年4月1日起正式施行，全部代替现行的GB5749-2006。在新版国家标准中水质指标由原来的106项调整为97项，包括常规指标43项和扩展指标54项；水质参考指标由原来的28项调整为55项。北京宝德仪器有限公司现有产品可帮助用户解决14项常规指标、4项扩展指标和4项水质参考指标的测定。

近几年来，随着国内科技产业的不断升级，对微电子器件的需求日益增加。特别是高科技产品的快速发展，比如智能手机、电脑、无人机、新能源汽车、智能机器人等，对高性能微电子器件的需求更是呈指数级增长，这使得微电子器件自然而然就成为人们研究的热点材料。在微电子器件的研究中，通常需要对微电子器件表面进行各种加工、改性处理，来使其具有不同的性能。由于X射线光电子能谱仪（XPS）是一种表面分析技术，随着商业化XPS设备的普及，其在微电子器件研究中的应用越来越广泛，逐渐成为微电子器件研究中不可或缺的分析手段。 本方案通过赛默飞最新一代XPS表面分析平台Nexsa G2，对半导体器件表面形成的窄条形SnOx成分进行小束斑+特色SnapMap快照成像测试，展示如何通过设备小束斑+成像功能，快速全面分析这类特殊小尺寸半导体器件表面成分及其在面内分布情况，来辅助评估表面处理效果及器件质量。