智能管理 | IPM 影像扫描序列管理平台

YSI 防玷污的10点技巧 随着电子技术的进步、电源管理的改进和电池寿命的延长，生物玷污成为目前决定监测仪器投放周期长度的决定因素，特别是应用于长期、连续监测。应用一些防玷污技术可以延长仪器的维护间隔，能够减少野外的仪器维护的次数，并提高水质监测数据精度。 防玷污技巧的详细内容请参考文章《YSI 防玷污的10点技巧》

文献名： Structural, morphological and optical properties of Bi NPs obtained by laser ablation and their selective detection of L-cysteine 作者： Ramon Gabriel Teixeira Rosaa, Celso de Araujo Duartea , Wido Herwig Schreinera, Ney Pereira Mattoso Filhoa, Arandi Ginane Bezerra Jr.b, Andersson Barisonc, Fernanda Maria Marins Ocamposc a Departamento de Física, Universidade Federal do Paraná Centro Politécnico, CP 19044, 81531-990 Curitiba (PR), Brazil b Departamento Acadêmico de Física, Universidade Tecnológica Federal do Paraná, 80230-901 Curitiba (PR), Brazil c Departamento de Química, Universidade Federal do Paraná Centro Politécnico, CP 19081, 81531-990 Curitiba (PR), Brazil 摘要：In the present work we show the results of the investigation of the properties of bismuth nanoparticles (NPs) obtained by the laser ablation in water. The samples were characterized by various techniques: UV/vis spectroscopy, dynamic light scattering, transmission electron microscopy, X-ray photoelectron spectroscopy, X-ray diffraction, nuclear magnetic resonance and zeta potential. The NPs were metallic and surface oxidated, exhibiting absorption peak at 257 nm due to the surface plasmon resonance. The interaction between the NPs and various amino acids was studied and revealed a selective sensibility to cysteine on a range of concentration from 80 to 720 μM, which we attribute to a dimerization of cysteine to cystine probably complexed to the nanoparticle surface by electrostatic interactions, leading to the modification of the NP absorption spectrum. 关键词：Bismuth; Nanoparticles; Laser ablation; Cysteine

二氧化硅是用于检测、控制和尽量减少涡轮机、换热器和锅炉结垢的一种关键度量。在线实时测量活性二氧化硅可尽量降低因结垢而产生的维修/更换成本，实现安全高效的长期运行，这款在线二氧化硅分析仪可用于对二氧化硅超标的生产用水的去除或回收进行即时或自动的决策。连续实时二氧化硅监测可快速通知离子交换树脂的RO穿透或饱和情况，从而使系统效率最大化，尽量减少维修停机时间。Orion 8030cX 在线二氧化硅分析仪可配置为在二氧化硅峰值出现时发送警告/警报或测量数据来警告用户，触发纠正措施，防止下游出现问题。

PCB、连接器和半导体等电子元件利用镀层来保护铜表面并提供良好的电接触。国际一流的IPC标准规范涵盖了PCB电镀镀层厚度结构，此类结构具有精确的镀层（包含若干层）厚度，以确保成品元件在器件的预期使用寿命内发挥应有的性能。 磁感应测厚仪可以快速、可靠地测量PCB上的铜层厚度，而台式XRF是测量金、镍、锡、银和钯镀层的首选技术，此类镀层形成了关键部件的电镀接触并保护底层的铜层。当前，在电子元件尺寸和复杂性方面面临着诸多挑战，因此，为该类应用领域选择的镀层厚度测量设备必须专门适用于测量电子元件。