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核心参数
仪器种类： 原子力显微镜
产地类别： 进口
定位检测噪声： XY≤0.3nm, Z≤15pm
样品尺寸： 直径≤20mm, 高度≤10mm
样品台移动范围： 5mm*5mm
压电响应力显微术 (PFM)
生物材料与铁电材料等的成像
许多材料的机电耦合行为，如生物基细胞膜和蛋白质，铁电和压电材料从现
在开始都可以用压电响应力显微镜来表征。
这一成像技术在开发基于铁电畴变等的新型电子设备方面引起了极大的关
注，在对将来电脑存储等领域的诸多应用方面的发展有着巨大的潜力。
压电响应力显微术是在扫描探针显微镜的基础上，在接触式扫描过程中对探
针施加一个交流电压，利用材料自身逆压电效应来探测样品表面形变的一类技术
总称（见图1）。压电响应力显微术已经成为铁电材料研究的重要手段，广泛应
用于纳米尺度畴结构的三维成像、畴结构的动态研究、畴结构控制和微区压电、
铁电、漏电等物理性能表征等领域。其最大的优势就是同时具有极高的分辨率
（~10-20 nm）和灵敏度（~0.1 pm/V）。
NT-MDT扫描探针Ntegra Prima PFM的工作原理介绍
扫描探针Ntegra Prima PFM的使用方法?
NT-MDTNtegra Prima PFM多少钱一台?
扫描探针Ntegra Prima PFM可以检测什么？
扫描探针Ntegra Prima PFM使用的注意事项？
NT-MDTNtegra Prima PFM的说明书有吗？
NT-MDT扫描探针Ntegra Prima PFM的操作规程有吗？
NT-MDT扫描探针Ntegra Prima PFM报价含票含运吗？
NT-MDTNtegra Prima PFM有现货吗？
更多
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EC AFM
In-situ control/modification of the surface morphology of single crystal and polycrystal electrodes (samples) during electrochemical process (in situ) in electrolyte solutions together with STM (max resolution – atomic) and AFM.
1932KB
2019/07/02
18 Near-Fild Optical Lithography in Application to Plasmonic Antennas Characterization
18 Near-Fild Optical Lithography in Application to Plasmonic Antennas Characterization
606KB
2019/07/01
17 Phase-sensitive plasmonics biosensors_ from bulk to nanoscale architechtures
17 Phase-sensitive plasmonics biosensors_ from bulk to nanoscale architechtures and novel functionalities
1914KB
2019/07/01
16 Subwavelength Focusing of Laser Light Using Zone Plates with Silver and Chromium Rings
16 Subwavelength Focusing of Laser Light Using Zone Plates with Silver and Chromium Rings
365KB
2019/07/01
15 The tight focusing of laser radiation using 4-sector polarization converter
15 The tight focusing of laser radiation using 4-sector polarization converter
1370KB
2019/07/01
14PlasmonichierarchicalnanostructureswithcascadedfieldenhancementandtheirSERSapplications
14PlasmonichierarchicalnanostructureswithcascadedfieldenhancementandtheirSERSapplications
578KB
2019/07/01
13 Controlling phase separation in vanadium dioxide thin films via substrate engineering
13 Controlling phase separation in vanadium dioxide thin films via substrate engineering
2081KB
2019/07/01
12 Use of scanning near-field optical microscope for detection of luminescent nanodiamond
12 Use of scanning near-field optical microscope with an aperture probe for detection of luminescent nanodiamond
777KB
2019/07/01
11DETECTIONOFLUMINESCENTNANODIAMONDSUSINGASCANNINGNEAR-FIELDOPTICALMICROSCOPEWITHANAPERTUREPROBE
11DETECTIONOFLUMINESCENTNANODIAMONDSUSINGASCANNINGNEAR-FIELDOPTICALMICROSCOPEWITHANAPERTUREPROBE
431KB
2019/07/01
10 Comparative study of post-growth annealing of Cu(hfac)2, Co2(CO)8 and Me2Au(acac)
10 Comparative study of post-growth annealing of Cu(hfac)2, Co2(CO)8 and Me2Au(acac) metal precursors deposited by FEBID
10047KB
2019/07/01
9 Tuning the photo-response in monolayer MoS2 by plasmonic nano-antenna
9 Tuning the photo-response in monolayer MoS2 by plasmonic nano-antenna
1156KB
2019/07/01
8 Fabrication of probes for scanning near-field optical microscopy using focused ion beam
8 Fabrication of probes for scanning near-field optical microscopy using focused ion beam
882KB
2019/07/01
7 Probing optical near-fields with photoreactive azo-polymers
7 Probing optical near-fields with photoreactive azo-polymers
976KB
2019/07/01
6 Investigation of Spatial Distribution of Photocurrent in the Plane of a Si p–n Photodiode
6 Investigation of Spatial Distribution of Photocurrent in the Plane of a Si p–n Photodiode with GeSi Nanoislands by Scanning Near-Field Optical Microscopy
445KB
2019/07/01
5 Scanning near-field microscopy of microdisk resonator with InP_GalnP quantum dots
5 Scanning near-field microscopy of microdisk resonator with InP_GalnP quantum dots using cantilever-based probes
1487KB
2019/07/01
4DependenceoftheFocalSpotParametersontheReliefHeightoftheAmplitudeZonePlate
4DependenceoftheFocalSpotParametersontheReliefHeightoftheAmplitudeZonePlate
880KB
2019/07/01
3 Tight Focusing of Circularly Polarized Laser Light by Amplitude Zone Plate with Chromium Rings
3 Tight Focusing of Circularly Polarized Laser Light by Amplitude Zone Plate with Chromium Rings
167KB
2019/07/01
2Tight focusing of laser light using a chromium Fresnel zone plate
2Tight focusing of laser light using a chromium Fresnel zone plate
2528KB
2019/07/01
1Complex for Nanoscale Researches by Using TERS, SNOM, BLS, and SPM Techniques
1Complex for Nanoscale Researches by Using TERS, SNOM, BLS, and SPM Techniques
1465KB
2019/07/01
SNOM近场光学显微镜
原理：用超越激光衍射极限的系统来研究样品 NTEGRA Spectra 在检测样品时，通过扫描近场光学显微术能提供超越激光光学衍射的光学分辨率。 支持两种不同的SNOM方式：光纤式SNOM和悬臂梁式SNOM所有的SNOM功能模式：透射模式，反射模式，收集模式。
5704KB
2019/06/27
NT-MDT AFM+Raman+SNOM原子力拉曼近场联用系统
为了研究针尖增强拉曼（TERS），NTEGRA Spectra实现了光谱仪/显微镜在纳米尺度的分辨率。特制的AFM探针可以使TERS信号增强，并且使光以纳米尺度聚焦到针尖区域。这种特制的AFM探针充当了一个纳米光源，使光学成像的分辨率突破了光的衍射极限，达到10nm。
3886KB
2019/06/27
NTEGRA PRIMA NT-MDT原子力显微镜
Prima 具有40 多种常规的SPM ，光谱和刻蚀工作模式。因此， Prima 可以及其方便地对样品进行高精度和高分辨成像。Prima 广泛应用于材料科学、生命科学、聚合物等诸多领域样品物理和化学特性的研究。
1093KB
2019/06/27
PFM压电响应力显微镜
本资料介绍了压电响应力原子力的原理及应用，包括我们产品的特色及参数。比较全面的介绍了产品的特征，性能稳定，操作简单等特点。
1022KB
2019/06/27
Magnetic_Force_Microscopy_nanoscale_magnetic_imaging_and_lithograph
The principle of Magnetic Force Microscopy (MFM) is based on the detection of the interaction between the sample and a nanosized magnetic probe
527KB
2019/06/27
开尔文探针力显微镜在光电领域应用
The Sun is an abundant, easily accessible power source that is currently underutilized, will possibly become the no-alternative choice for electrical power of humankind
2092KB
2019/06/27
EFM
The electrostatic interaction between a model probe and a sample in a scanning probe microscope is analyzed. A simple model for a real experimental setup is proposed and solved by means of an appropriate approximation. In addition, a quantitative definition for resolution is presented. We find that generally the total force between tip and sample is dominated by contributions which are not confined to a nanometer-sized region under the tip apex.
425KB
2019/06/27
Electrochemistry at nanoscale
Electrochemical (EC) technologies attract constantly rising interest because it is the way for controlled modifications of the surface even with atomic precision. EC deposition is a widely used approach for creation of thin metal films with unique properties. On the other hand EC dissolution allows imitation and study of corrosion processes. Scanning probe microscopy
466KB
2019/06/27
企业名称
八帆仪器设备（上海）有限公司
企业信息已认证
企业类型
信用代码
310115003577137
成立日期
2017-12-15
注册资本
100
经营范围
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八帆仪器设备（上海）有限公司
公司地址
上海市闵行区新骏环路189号漕河泾开发区创新创业园C座413室
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公司名称： 八帆仪器设备（上海）有限公司
公司地址： 上海市闵行区新骏环路189号漕河泾开发区创新创业园C座413室 联系人： 上海办公室 邮编： 201114 联系电话： 400-860-5168转4410
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