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当前位置: 光傲科技 > 其它光学测量仪 > 太阳光谱反射率及发射率测量仪

太阳光谱反射率及发射率测量仪

品牌: AZ technology
产地: 美国
型号: TESA 2000
报价: 面议
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产品介绍

TESA2000是在TEMP 2000A基础上增加光谱半球反射率测定功能,光谱范围250 nm to 2500 nm ,主要用于材料太阳光谱吸收、反射特性测试。

 AZ Technology's TESA 2000 Portable Emissometer/Reflectometer and Solar Reflectometer, is compact, lightweight, rugged, and ergonomically engineered for ease of use in the field or in the laboratory to determine ambient temperature total emittance and solar reflectance of test surfaces.

The TESA 2000 can be conveniently used in a laboratory setting (top right image) where samples can be sat atop the instrument and left while repeated measurements are being taken, or as a portable unit (bottom right image).

The TESA 2000 provides in a single unit:

1) A portable emissometer/reflectometer that performs optically integrated total hemispheric reflectance measurements from less than 3 to greater than 35 micrometers wavelength. Thus, performing the same measurement as the TEMP 2000A (the recognized replacement for the no longer produced Gier Dunkle DB-100 IR Reflectometer**), providing improved emittance determination performance and maintainability, and in accordance with the ASTM E408 standard.

2) A portable solar reflectometer that performs optically integrated total hemispheric reflectance measurements.

The TESA 2000 optical system has been designed to minimize losses, to facilitate and maintain optical alignment, and to utilize the features of AZ Technology's patented ellipsoid collector (Patent Number 5,659,397) that allows compactness for portability, efficiency, and measurement accuracy. The instrument is fully portable and can be used in the most remote locations. The instrument is available with carrying cases (which will fit in the overhead bin of most jet aircraft), rechargeable batteries, battery charger, instrument inspection head, display unit, and an operator vest.



The table below lists specifications for the TESA 2000.

Emittance wavelength <3um to >35um (not limited by filters, windows, etc.) Reflectance wavelength 250 to 2500 nm Measurement accuracy (for specular and diffuse samples) - &plusmn; 1% of full scale for gray samples  - &plusmn; 3% of full scale for non-gray samples Repeatability- &plusmn; 0.5% of full scale or better Sample type Any Sample, including foils, insulators, etc. Sample size and geometry-Flat Surfaces: &ge; 0.4 inches (1 cm) diameter Sample temperature Room Temperature, Ambient Readouts -Digital LCD panel meter -Selectable solar reflectance solar absorption and IR reflectance/emittance display Measurement range (reflectance) 0.05 to 1.00 Dimensions-Optical Head: 5" diameter x 8" long -Control and Display Unit: 7.5 x 5.5 x 3 inches -Battery Box: 7.5 x 6.25 x 4.0 inches -Carry Case: 12.5 x 17 x 11 inches Weight-Optical Head: 6 pounds -Control and Display Unit: 3.25 pounds -Battery Box: 11 pounds -Carry Case: 9 pounds Warranty 1 year parts and labor

*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably. **The TESA 2000 represents an excellent option for replacing a Gier Dunkle DB100 while adding more capabilities and increased portability



 
 


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中远红外反射率测试仪

型号:SPECTRAFIRE

面议

工商信息

企业名称

上海雷昭光电测控技术有限公司

企业信息已认证

企业类型

有限责任公司(自然人投资或控股)

信用代码

91310114681017050L

成立日期

2008-10-27

注册资本

人民币100.0000万元整

经营范围

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光傲科技股份有限公司为您提供AZ technology太阳光谱反射率及发射率测量仪TESA 2000,AZ technologyTESA 2000产地为美国,属于其它光学测量仪,除了太阳光谱反射率及发射率测量仪的参数、价格、型号、原理等信息外,还可为您提供中远红外反射率测试仪,光傲科技客服电话400-860-5168转2948,售前、售后均可联系。

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