该系统对测量和评价薄膜电子和空穴的迁移率非常关键,主要是用于EL元件和太阳能电池。该系统由一个短脉冲激光激发的载流子产生氮模具,高速采样电子,样品室和数据处理系统。我们的防噪声系统和独特的信号处理降低了噪声明显,响应速度快,如纳米二阶和高灵敏度已经达到为了测量电子和空穴的迁移率。更换不同的模具(作为一个选项)模具的激光使系统振荡的波长范围从分子与脉冲宽度缩短600皮秒荧光。除此之外,TOF法测量,可选单位系统能通过FET的方法测量的迁移率(选项)。
原理:
脉冲光照射样品。然后用示波器测量电荷的流动速度
光脉冲照射到薄膜样品,被施加电压到薄膜样品。
主要应用:
测试有机半导体和有机薄膜的载流子迁移率
The Model CMM-250 has been designed to measure the electron and hole mobilities which are very critical to evaluation of the thin film to be used for the EL elements and solar cells. The system consists of a short pulse nitrogen excitation die laser for carrier generation, high speed sampling electronics, sample compartment and data processing system. Our noise prevention system and unique signal processing have reduced noise significantly so that fast response such as nano-second order and high detection sensitivity have been achieved in order to measure the electron and hole mobilities. Changing different die ( as an option ) of the die laser enables the system to oscillate the wavelength range from 337nm to 730nm with pulse width shortened in 600 pico second. In addition to this TOF method measurement, the system with an optional unit is capable to measure mobilities by FET method(option).
Features
? Achievement of time resolution at nano-second enables the system to measure mobility such as 10-7-10-1cm2/V·sec( this maybe changed depending on the sample and its thickness).
? Easy Operation with probe/sample compartment
? New designed optics and data processing enabled to obtain high SN ratio data
Measurement
Mobility calculation
While checking the measurement data, mobility can be easily calculated.
By putting cursor on the inflection point, mobility can be calculated automatically while seeing the logarithmic converted data.
Signal processing
In addition to noise prevention, our unique signal processing enables the system to calculate very small signal data with large noise. The measurement can be applied to the thinner film or high mobility sample, which extends the measurement range.
FET Measurement ( Option )
Adding the optional probe and software to the system is enabled to measure mobility measurement for FET type element.
其他半导体检测仪CMM-250的工作原理介绍
其他半导体检测仪CMM-250的使用方法?
CMM-250多少钱一台?
其他半导体检测仪CMM-250可以检测什么?
其他半导体检测仪CMM-250使用的注意事项?
CMM-250的说明书有吗?
其他半导体检测仪CMM-250的操作规程有吗?
其他半导体检测仪CMM-250报价含票含运吗?
CMM-250有现货吗?
企业名称
海埃飞电子科技有限公司
企业信息已认证
企业类型
有限责任公司(自然人独资)
信用代码
Q13101114MA1CT3KC5K
成立日期
2015-12-16
注册资本
人民币300.0000万元整
经营范围
从事电子技术领城内的技术开发、技术咨询、技术服务。家川山器、仪器仪表、电子产品、数码产品、电子元器件、通讯器材、安防产品,汽车饰品、通信设备及州关产品、计算机、软件及轴助设备、照明设备、灯具、汽车装配件、金属制品、玻成制品的销售,商务咨询,图文设计制作,公务服务,通信工程,网络工程,从事货物与技术的进出口业务。[依法须经批准的项目,经相关部门批准后方可开展经营活动)
上海沃埃得贸易有限公司
公司地址
上海市闸北区共和新路3699号共和国际A1707
客服电话