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AIS系列扫描电镜的结构, 软硬件特点 详细技术参数
AIS2300C型扫描电镜 英文版样本, 主要内容:仪器结构软硬件特点 仪器详细技术指标
从侧面显示, 电子枪,电磁透镜,扫描线圈,象散校正线圈,探测器控制,以及真空系统等所有电子显微镜的控制电器巧妙地集成设计,有效地利用空间,减少占地面积,让操作者躯体有较大的伸展空间。
AIS2200C sem is a powerful analytical instrument with all the versatile analysis tools in one. In addition to the extraordinary surface-sensitive imaging performance, this SEM integrates various analytical capabilities such as EDS, WDS and EBSD to help lab.users to turn images into actionable information. AIS2200 easily adapts different analytical tasks. AIS2200 has high compatibility with any analysis tool because of a conical lens over 60o to meet versatile attachments. It has high accomplishment in a technical view-point against other competitors as analytical instrument. AIS2200 provides 3nm resolution with beam currents that range from 1kV to as high as 30 kV accelerating voltage without compromising the analytical capabilities, sample flexibility or ease of use of a traditional analytical SEM. New and innovative electron-optical elements together with field-Proven. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images.